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Peters, P.

Publications and source records attributed to Peters, P..

Pressure Effect in ZnO Films Using Off-Axis Sputtering Deposition

ZnO films are deposited on (0001) sapphire, (001) Si and quartz substrates using the off-axis reactive magnetron sputtering deposition. Based on film thickness measurements, three transport regions of sputtered particles are observed when films are deposited in the pressure regions of 5 mtorr - 150 mtorr. X-ray diffraction, scanning probes microscopy, and electrical measurements are also used to characterize these films. The full width at half maximum of theta rocking curves for epitaxial films is less than 0.5 deg. In textured films, it rises to several degrees. The epitaxial films deposited at high pressure reveal a flat surface with some hexagonal facets. The density of hexagonal facets decreases when the growth pressure is reduced. The resistivity of these epitaxial films also depends on the growth pressures. A relationship between the pressure effects and film properties are discussed.

Zhu, Shen

Measurement of Interfacial Undercooling in a Dilute Pb-Sn Alloy Near the Regime of Morphological Instability

The solid/liquid (s/1) interfacial Seebeck technique was used to measure interfacial undercooling in a Pb-1 wt.% Sn alloy. For plane front solidification an undercooling in the range of 0.54-0.57C was recorded. However, for growth velocities between 6 to 15 micron/s the undercooling, increased with increase in velocity. 'Tbis is in contradiction to the theoretical predictions based on growth at the extremum condition. A modified analytical expression was developed based on the maro,,inal stability criterion to predict undercooling for growth velocities immediately over the limit of morphological stability. Between 6 to 15 microns/s the trend predicted by this modified expression is in qualitative agreement with the experimental results. This model is more consistent with the analysis of Venugopal and Kirkaldy which states that the extremum condition criterion is not applicable in the marginal stability regime. At higher growth velocities between 20 and 50 microns/s where stable cellular growth is expected the undercooling, decreased with increase in velocity. The predictions of Burden and Hunt based on extremum criterion agree reasonably well with the experimental results in this velocity range. Finally, the importance of non-equilibrium phase diagram parameters such as partition coefficient and liquidus slope were also evaluated using the experimental undercooling results obtained in this investigation.

Sen, S.

Real Time Characterization of Solid/Liquid Interfaces During Directional Solidification

A X-Ray Transmission Microscope (XTM) has been developed to observe in real time and in-situ solidification phenomenon at the solid/liquid interface. Recent improvements in the horizontal Bridgman furnace design provides real-time magnification (during solidification) up to 12OX. The increased magnification has enabled for the first time the XTM imaging of real-time growth of fibers and particles with diameters of 3-6 micrometers. Further, morphological transitions from planar to cellular interfaces have also been imaged. Results from recent XTM studies on Al-Bi monotectic system, Al-Au eutectic system and interaction of insoluble particles with s/I interfaces in composite materials will be presented. An important parameter during directional solidification of molten metal is the interfacial undercooling. This parameter controls the morphology and composition at the s/I interface. Conventional probes such as thermocouples, due to their large bead size, do not have sufficient resolution for measuring undercooling at the s/I interface. Further, the intrusive nature of the thermocouples also distorts the thermal field at the s/I interface. To overcome these inherent problems we have recently developed a compact furnace which utilizes a non-intrusive technique (Seebeck) to measure undercooling at the S/I interface. Recent interfacial undercooling measurements obtained for the Pb-Sn system will be presented. The Seebeck measurement furnace in the future will be integrated with the XTM to provide the most comprehensive tool for real time characterization of s/I interfaces during solidification.

Sen, S.

Observation of Be-7 on the surface of LDEF spacecraft

Significant quantities of Be-7 have been found on the leading edge of the Long Duration Exposure Facility (LDEF), which was returned to earth after almost six years in space. Although the absolute atmospheric concentration of Be-7 needed to explain this detection is extremely small, its concentration at LDEF's altitude must be several orders of magnitude higher than in the stratosphere below, where it is produced by cosmic-ray reactions with atmospheric nitrogen and oxygen nuclei. The detection may lead to the use of Be-7 as an exoatmospheric tracer as well as to studies of surface interactions in space.

Fishman, G. J.

Requirements and an approach for coating the Gravity Probe B gyroscope rotor

A process to coat a quartz gyroscope rotor uniformly with superconducting niobium as part of a NASA sponsored experiment to test general relativity is described. The requirements for uniformity, film adhesion, and superconducting properties of the niobium thin film rotor coating are discussed. A uniformity of 1.5 percent (peak to valley) (38 nm) with good adhesion, no pinholes larger than 0.25 mm, transition temperature of 9.8 K, and the ability to survive repeated thermal cycling to 4.2 K have been achieved. Problems concerning abrasive damage and electrical arc damage during earthbound testing have been observed. Many hours of ground-based gyro operation demonstrate the applicability of this approach to rotor coating.

Gill, D.

Development of low-temperature transistor modules to improve the MSFC mid-infrared array

This report describes the low-temperature transistor modules designed for use with the MSFC mid-infrared array. The modules were developed in the Space Science Laboratory at Marshall Space Flight Center with Center Director's Discretionary Funds. The transistors (JFETs), which operate at a temperature of 77 K, are epoxied to a copper surface attached to a Teflon substrate. The module substrate insulates the JFETs from the 1.5K detector work surfaces and provides a convenient mounting structure for additional components such as solder pins. These modules have maintained their structural integrity during repeated temperature cycling, and they have to be convenient during maintenance and servicing of the infrared array.

Telesco, C. M.