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Pepper, Stephen V.

Publications and source records attributed to Pepper, Stephen V..

42 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS1990

Thermal stability of electron-irradiated poly(tetrafluoroethylene) - X-ray photoelectron and mass spectroscopic study

Polytetrafluoroethylene (PTFE) was subjected to 3 keV electron bombardment and then heated in vacuum to 300 C. The behavior of the material as a function of radiation dose and temperature was studied by X-ray photoelectron spectroscopy (XPS) of the surface and mass spectroscopy of the species evolved. Lightly damaged material heated to 300 C evolved saturated fluorocarbon species, whereas unsaturated fluorocarbon species were evolved from heavily damaged material. After heating the heavily damaged material, those features in the XPS spectrum that were associated with damage diminished, giving the appearance that the radiation damage had annealed. The observations were interpreted by incorporating mass transport of severed chain fragments and thermal decomposition of severely damaged material into the branched and cross-linked network model of irradiated PTFE. The apparent annealing of the radiation damage was due to covering of the network by saturated fragments that easily diffused through the decomposed material to the surface region upon heating.

Wheeler, Donald R.↗
NASA NTRS1989

Infrared Pyrometry From Room Temperature To 700 Degrees C

Consistent readings obtained when specimens prepared appropriately. New method largely overcomes limitations. Transmission of infrared increased by replacing customary metal-coated glass viewing port with quartz viewing port covered with tantalum mesh. Commercially available infrared microscope with focal distance of 53 cm focuses on spot only 1 mm wide on specimen. Microscope operated as radiometer. Output of detector varies by several orders of magnitude, processed by logarithmic amplifier before reading.

Wheeler, Donald R.↗
NASA NTRS1989

Fundamentals of tribology at the atomic level

Tribology, the science and engineering of solid surfaces in moving contact, is a field that encompasses many disciplines: solid state physics, chemistry, materials science, and mechanical engineering. In spite of the practical importance and maturity of the field, the fundamental understanding of basic phenomena has only recently been attacked. An attempt to define some of these problems and indicate some profitable directions for future research is presented. There are three broad classifications: (1) fluid properties (compression, rheology, additives and particulates); (2) material properties of the solids (deformation, defect formation and energy loss mechanisms); and (3) interfacial properties (adhesion, friction chemical reactions, and boundary films). Research in the categories has traditionally been approached by considering macroscopic material properties. Recent activity has shown that some issues can be approached at the atomic level: the atoms in the materials can be manipulated both experimentally and theoretically, and can produce results related to macroscopic phenomena.

Ferrante, John↗
NASA NTRS1988

Surface temperature determination in surface analytic systems by infrared optical pyrometry

An IR pyrometric technique for measuring the surface temperatures of metal specimens in an ultrahigh-vacuum analytic chamber is described and demonstrated. The experimental setup comprises a commercial IR microscope with a long-working-distance right-angle objective (focal spot diameter 1 mm at 53 cm), a metal-coated glass vacuum chamber with a Ta-mesh-covered quartz viewport, an Mo specimen stub with an internal heating element, and a Ta disk test specimen with a flat side coated with a high-emissivity graphite film. The results of an initial calibration test are presented graphically and briefly characterized. The measurement error at 450 C is found to be less than 10 C.

Wheeler, Donald R.↗
NASA NTRS1988

Auger analysis of a fiber/matrix interface in a ceramic matrix composite

Auger electron spectroscopy (AES) depth profiling was used to characterize the fiber/matrix interface of an SiC fiber, reaction bonded Si3N4 matrix composite. Depth profiles of the as received double coated fiber revealed concentration oscillations which disappeared after annealing the fiber in the environment used to fabricate the composite. After the composite was fractured, the Auger depth profiles showed that failure occurred in neither the Beta-SiC fiber body nor in the Si3N4 matrix but, concurrently, at the fiber coating/matrix interface and within the fiber coating itself.

Honecy, Frank S.↗
NASA NTRS1988

Auger analysis of a fiber/matrix interface in a ceramic matrix composite

Auger electron spectroscopy (AES) depth profiling was used to characterize the fiber/matrix interface of an SiC fiber, reaction bonded Si3N4 matrix composite. Depth profiles of the as received double coated fiber revealed concentration oscillations which disappeared after annealing the fiber in the environment used to fabricate the composite. After the composite was fractured, the Auger depth profiles showed that failure occurred in neither the Beta-SiC fiber body nor in the Si3N4 matrix but, concurrently, at the fiber coating/matrix interface and within the fiber coating itself.

Honecy, Frank S.↗