Engineering topics

Ott, F. M.

Publications and source records attributed to Ott, F. M..

3 records

NASA NTRS1986

Determining Internal Connections in Capacitors

Simple electrical test shows which terminals connected to outer capacitor foil. Test makes it unnecessary to resort to X-ray inspection to distinguish terminals. When outer foil of capacitor is attached to ungrounded signal-generator output lead, oscilloscope displays higher waveform amplitude. When outer foil is joined to grounded signalgenerator output lead, waveform amplitude is lower. Test also used to determine internal connections in multiple-element capacitors.

Ott, F. M.↗

NASA NTRS1985

Review of the NASA Voyager spacecraft polycarbonate capacitor failure incident

The premission failure of a Voyager spacecraft capacitor has prompted an investigation into the use of polycarbonate capacitors in high impedance circuits, during which capacitor failures were induced by thermal cycling together with extended periods at high temperature. Measurement of leakage path temperature coefficients indicates that there are two distinct leakage types whose mechanisms are complicated by movement within the capacitor during temperature changes. A novel system for pulse detection during capacitor burn-in and ramp testing has proven to be beneficial.

Ott, F. M.↗

NASA NTRS1985

Capacitor-Test System

Polycarbonate film capacitors tested for leakage paths with microprocessor controlled multiplexer test sequence. Microprocessor based capacitor test system simultaneously monitors 80 capacitors.

Ott, F. M.↗