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Noel, G. T.

Publications and source records attributed to Noel, G. T..

16 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1983

Source circuit design considerations

The cost of several circuit configurations for large (5MW) array fields were investigated to assess the relative costs of high and low voltage configurations. Three source circuit NOC voltages were evaluated: 400V (ungrounded), 800V (+ or 400V center grounded), and 2000V (+ or - 1000V center grounded). Four source circuit configurations were considered for each of the three NOC voltages. The configurations correspond to source circuit currents of 15, 30, 45, and 60 amperes, respectively. Conceptual layouts for 5MW building blocks for each of the above configurations were developed. The designs were optimized to minimize BOS electrical and structural costs. Only the BOS electrical costs were evaluated. The designs were broken down into the following elements for cost: (1) basic source circuit intermodule wiring, bypass diodes and associated hardware, source circuit to J-Box wiring, etc; (2) J-Box blocking diodes, varistors, heat sinks, and housing; (3) disconnects source circuit disconnects, fuses, and housing; (4) bus cabling J-Box to PCU interface wiring, and trenching; (5) interface bus bar, group disconnects, and fuses; and (6) fault detection shunts, signal wire, electronics, and alarm. It is concluded that high voltage low current circuits are not economical, at higher currents high and low voltage circuit costs approach each other, high voltage circuits are not likely to offer near term advantage, and development work/manufacturer stimulation is needed to develop low cost high voltage hardware.

Noel, G. T.↗
NASA NTRS1979

Development of an Accelerated Test Design for Predicting the Service Life of the Solar Array at Mead, Nebraska

An accelerated life test is described which was developed to predict the life of the 25 kW photovoltaic array installed near Mead, Nebraska. A quantitative model for accelerating testing using multiple environmental stresses was used to develop the test design. The model accounts for the effects of thermal stress by a relation of the Arrhenius form. This relation was then corrected for the effects of nonthermal environmental stresses, such as relative humidity, atmospheric pollutants, and ultraviolet radiation. The correction factors for the nonthermal stresses included temperature-dependent exponents to account for the effects of interactions between thermal and nonthermal stresses on the rate of degradation of power output. The test conditions, measurements, and data analyses for the accelerated tests are presented. Constant-temperature, cyclic-temperature, and UV types of tests are specified, incorporating selected levels of relative humidity and chemical contamination and an imposed forward-bias current and static electric field.

Gaines, G. B.↗
NASA NTRS1979

Measurement Techniques and Instruments Suitable for Life-prediction Testing of Photovoltaic Arrays

The validation of a 20-year service life for low-cost photovoltaic arrays is a critical requirement in the Low-Cost Solar Array (LSA) Project. The validation is accomplished through accelerated life-prediction tests. A two-phase study was conducted to address the needs before such tests are carried out. The results and recommended techniques from the Phase 1 investigation are summarized in the appendix. Phase 2 of the study is covered in this report and consisted of experimental evaluations of three techniques selected from these recommended as a results of the Phase 1 findings. The three techniques evaluated were specular and nonspecular optical reflectometry, chemiluminescence measurements, and electric current noise measurements.

Noel, G. T.↗
NASA NTRS1979

Development of an Accelerated Test Design for Predicting the Service Life of the Solar Array at Mead, Nebraska

Potential long-term degradation modes for the two types of modules in the Mead array were determined and judgments were made as to those environmental stresses and combinations of stresses which accelerate the degradation of the power output. Hierarchical trees representing the severity of effects of stresses (test conditions) on eleven individual degradation modes were constructed and were pruned of tests judged to be nonessential. Composites of those trees were developed so that there is now one pruned tree covering eight degradation modes, another covering two degradation modes, and a third covering one degradation mode. These three composite trees form the basis for selection of test conditions in the final test plan which is now being prepared.

Gaines, G. B.↗
NASA NTRS1978

Evaluation available encapsulation materials for low-cost long-life silicon photovoltaic arrays

Experimental evaluation of selected encapsulation designs and materials based on an earlier study which have potential for use in low cost, long-life photovoltaic arrays are reported. The performance of candidate materials and encapsulated cells were evaluated principally for three types of encapsulation designs based on their potentially low materials and processing costs: (1) polymeric coatings, transparent conformal coatings over the cell with a structural-support substrate; (2) polymeric film lamination, cells laminated between two films or sheets of polymeric materials; and (3) glass-covered systems, cells adhesively bonded to a glass cover (superstrate) with a polymeric pottant and a glass or other substrate material. Several other design types, including those utilizing polymer sheet and pottant materials, were also included in the investigation.

Carmichael, D. C.↗
NASA NTRS1978

Measurement techniques and instruments suitable for life-prediction testing of photovoltaic arrays

Array failure modes, relevant materials property changes, and primary degradation mechanisms are discussed as a prerequisite to identifying suitable measurement techniques and instruments. Candidate techniques and instruments are identified on the basis of extensive reviews of published and unpublished information. These methods are organized in six measurement categories - chemical, electrical, optical, thermal, mechanical, and other physicals. Using specified evaluation criteria, the most promising techniques and instruments for use in life prediction tests of arrays were selected.

Noel, G. T.↗
NASA NTRS1978

Measurement requirements and techniques for degradation studies and lifetime prediction testing of photovoltaic modules

Tests of weathering and aging behavior are being developed to characterize the degradation and predict the lifetimes of low-cost photovoltaic arrays. Environmental factors which affect array performance include UV radiation, thermal energy, water, oxygen (generally involved in synergistic effects with UV radiation or high temperatures), physical stress, pollutants (oxides of nitrogen, sulfur dioxide and ozone), abrasives and dirt. A survey of photovoltaic array testing has shown the need to establish quantitative correlations between certain measurable properties (carbonyl formation, glass transition temperature, and molecular weight change) and modes of degradation and failure.

Noel, G. T.↗
NASA NTRS1978

Performance degradation mechanisms and modes in terrestrial photovoltaic arrays and technology for their diagnosis

Accelerated life-prediction test methodologies have been developed for the validation of a 20-year service life for low-cost photovoltaic arrays. Array failure modes, relevant materials property changes, and primary degradation mechanisms are discussed as a prerequisite to identifying suitable measurement techniques and instruments. Measurements must provide sufficient confidence to permit selection among alternative designs and materials and to stimulate widespread deployment of such arrays. Furthermore, the diversity of candidate materials and designs, and the variety of potential environmental stress combinations, degradation mechanisms and failure modes require that combinations of measurement techniques be identified which are suitable for the characterization of various encapsulation system-cell structure-environment combinations.

Noel, G. T.↗
NASA NTRS1977

Investigation of the double exponential in the current-voltage characteristics of silicon solar cells

Difficulties in relating observed current-voltage characteristics of individual silicon solar cells to their physical and material parameters were underscored by the unexpected large changes in the current-voltage characteristics telemetered back from solar cells on the ATS-1 spacecraft during their first year in synchronous orbit. Depletion region recombination was studied in cells exhibiting a clear double-exponential dark characteristic by subjecting the cells to proton irradiation. A significant change in the saturation current, an effect included in the Sah, Noyce, Shockley formulation of diode current resulting from recombination in the depletion region, was caused by the introduction of shallow levels in the depletion region by the proton irradiation. This saturation current is not attributable only to diffusion current from outside the depletion region and only its temperature dependence can clarify its origin. The current associated with the introduction of deep-lying levels did not change significantly in these experiments.

Wolf, M.↗
NASA NTRS1976

Investigation of the double exponential in the current-voltage characteristics of silicon solar cells

A theoretical analysis is presented of certain peculiarities of the current-voltage characteristics of silicon solar cells, involving high values of the empirical constant A in the diode equation for a p-n junction. An attempt was made in a lab experiment to demonstrate that the saturation current which is associated with the exponential term qV/A2kT of the I-V characteristic, with A2 roughly equal to 2, originates in the space charge region and that it can be increased, as observed on ATS-1 cells, by the introduction of additional defects through low energy proton irradiation. It was shown that the proton irradiation introduces defects into the space charge region which give rise to a recombination current from this region, although the I-V characteristic is, in this case, dominated by an exponential term which has A = 1.

Wolf, M.↗
NASA NTRS1976

Experiments to evaluate high-temperature rolling as a low-cost process for silicon solar cells

Mechanical rolling (a process used in industry for producing large quantities of metallic sheet and strip) has been suggested for the rapid low-cost manufacture of silicon sheet to be used for photovoltaic power generation equipment, such as solar arrays. The advantages of rolling include: high rates of production, wide sheets as products, good control of dimension, and (in the case of solar grade silicon) minimal development of impurities. Experiments have been performed using high-temperature, high-speed compression of polycrystalline silicon cylinders. Metallography and X-ray diffraction techniques have been used to examine the samples both before and after compression, and a model process has been designed to evaluate the technical practicality and economic feasibility of the method.

Noel, G. T.↗