Investigating the Effects of Individual Neutron-Induced Defects in Bipolar Junction Transistors
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Banerjee, Sneha↗
Engineering topics
Musson, Lawrence Cale
Publications and source records attributed to Musson, Lawrence Cale.
VALIDATION OF DISPLACEMENT DAMAGE
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Maupin, Kathryn Anne↗
TCAD-Optimization Coupling Enabled TID Modeling and Calibration of Commercial SiC Power MOSFET
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Gao, Xujiao↗
Data-driven compact photocurrent models: A system identification approach for non-intrusive reduced order modeling of dose-rate induced photocurrents.
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Bochev, Pavel B.↗