Fast Neutron Resonance Tomography using Double Scatter Spectroscopy for Materials Identification.
Abstract not provided.
Marleau, Peter↗
Engineering topics
Mrowka, Stanley
Publications and source records attributed to Mrowka, Stanley.
Serum peptide enrichment using restricted access media in combination with proteolysis of high-abundance high molecular weight proteins.
Abstract not provided.
Chirica, Gabriela↗
Reflectivity of silicon carbide in the extreme ultraviolet
Reflectivity and scattering measurements on samples of SiC manufactured by a variety of processes. Measurements were made from near-normal to grazing incidence at wavelengths in the range of 114 to 1216 A. CVD SiC displays the highest reflectivity at EUV wavelengths and normal incidence. At grazing incidence, Si-rich samples show reflectivity cutoff identical to polycrystalline Si. From the limited data available for single-crystal material, it is concluded that CVD material has comparable performance.
Mrowka, Stanley↗
The extreme Ultraviolet Explorer Spectrometer - Performance characteristics based on development of the collimator, variable line space gratings, telescope and detectors
Explore the source record for details and available documents.
Martin, Christopher↗