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Morris, C. S.

Publications and source records attributed to Morris, C. S..

Calibration of TOPEX/POSEIDON at Platform Harvest

We present estimates for the mean bias of the TOPEX/POSEIDON NASA altimeter (ALT) and the Centre National d'Etudes Spatiales altimeter (SSALT) using in-situ data gathered at Platform Harvest during the first 36 cycles of the mission. Data for 21 overflights of the ALT and six overflights of the SSALT have been analyzed. The analysis includes an independent assessment of in-situ measurements of sea level, the radial component of the orbit, wet tropospheric path delay, and ionospheric path delay. (The sign convention used is such that, to correct the geophysical data record values for sea level, add the bias algebraically. Unless otherwise stated, the uncertainty in a given parameter is depicted by +/- sigma(sub x), where sigma(sub x) is the sample standard deviation of x about the mean.) Tide gauges at Harvest provide estimates of sea level with an uncertainty of +/- 1.5 cm. The uncertainty in the radial component of the orbit is estimated to be +/- 1.3 cm. In-situ measurements of tropopsheric path delay at Harvest compare to within +/- 1.3 cm of the TOPEX/POSEIDON microwave radiometer, and in-situ measurements of the ionospheric path delay compare to within -0.4 +/- 0.7 cm of the dual-frequency ALT and 1.1 +/- 0.6 cm of Doppler orbitography and radiopositioning integrated by satellite. We obtain mean bias estimates of -14.5 +/- 2.9 cm for the ALT and +0.9 +/- 3.1 cm for the SSALT (where the uncertainties are based on the standard deviation of the estimated mean (sigma(sub bar x/y), which is derived from sample statistics and estimates for errors that cannot be observed). These results are consistent with independent estimates for the relative bias between the two altimeters. A linear regression applied to the complete set of data shows that there is a discernable secular trend in the time series for the ALT bias estimates. A preliminary analysis of data obtained through cycle 48 suggests that the apparent secular drift may be the result of a poorly sampled annual signal.

Christensen, E. J.

Overview of the TOPEX/Poseidon Platform Harvest Verification Experiment

An overview is given of the in situ measurement system installed on Texaco's Platform Harvest for verification of the sea-level measurement from the TOPEX/POSEIDON satellite. The pre-launch error budget suggested that the total root mean square (RMS) error due to measurements made at this verification site would be less than four centimeters.

satellite

Calibration of TOPEX/Poseidon at Platform Harvest

We present preliminary estimates for the mean bias of the TOPEX/Poseidon NASA altimeter (ALT) and the CNES altimeter (SSALT) using in situ data gathered at platform Harvest during the first 36 cycles of the mission. Data for 21 overflights of the ALT and 3 overflights of the SSALT have been analyzed.

TOPEX/Poseidon

Evaluation of the TOPEX/Poseidon Altimeter System Over the Great Lakes

The TOPEX/POSEIDON altimeter measurement system is evaluated over the Great Lakes. Using in situ lake level measurements, the temporal variations in lake level are removed from the altimeter measurements, thus permitting the performance of the altimeter system to be assessed.

TOPEX/POSEIDON

The light curve of periodic comet Halley 1910 II

Photometric parameters for periodic comet Halley 1910 II have been derived from 144 total visual magnitude estimates. The pre-perihelion data are best represented by an absolute magnitude of 5.47 and a power-law exponent of 4.44; post-perihelion results show that the absolute magnitude brightened to 4.94, and the exponent decreased to 3.07. Only small fluctuations in brightness about the power-law solutions are noted. Based on these results, a forecast of the visual brightness of periodic comet Halley's 1985-1987 apparition is presented.

Morris, C. S.

Comet brightness parameters: Definition, determination, and correlations

The power-law definition of comet brightness is reviewed and possible systematic influences are discussed that can affect the derivation of m sub o and n values from visual magnitude estimates. A rationale for the Bobrovnikoff aperture correction method is given and it is demonstrated that the Beyer extrafocal method leads to large systematic effects which if uncorrected by an instrumental relationship result in values significantly higher than those derived according to the Bobrovnikoff guidelines. A series of visual brightness parameter sets are presented which have been reduced to the same photometric system. Recommendations are given to insure that future observations are reduced to the same system.

Meisel, D. D.

Thin-film technology development

Thin film interconnect patterns developed for three hybrid satellite resistor, diode, and transistor circuit applications

THIN FILM

Semiconductor diffusion technology

Production capability for specific monolithic and hybrid semiconductor circuits and standard test mask incorporating transistor and resistor patterns

MASK