Engineering topics
Publications and source records attributed to Michael J Campola.
Single event effects measurements were conducted on a ACPL-785E optocoupler at NASA Space Radiation Laboratory. Measurements with a periodic input signal show single event transients and a radiation-induced time delay of the output signal.
The purpose of this study was to examine the displacement damage susceptibility of the OMT1090 optical switch manufactured by TT Electronics / OPTEK Technology Inc. and compare it to the results of the OPB847TXV.
Single event effects measurements were conducted on an ACPL-785E optocoupler at NASA Space Radiation Laboratory. Measurements with a periodic input signal show single event transients and a radiation-induced time delay of the output signal.
Based on the need to develop and adopt timely and up-to-date guidance to ensure that natural space radiation environment threats do not compromise mission success, the NASA Engineering and Safety Center (NESC) was solicited to develop and publish guidance for deriving radiation hardness assurance (RHA) requirements and for evaluating avionics hardware elements with respect to total ionizing dose, total non-ionizing dose, and single event effects. This document contains the outcome of the NESC assessment.
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, and bipolar devices.
Analog single-event transient results are analyzed for two different applications within one system architecture. Application-specific analyses are presented on the MAX4595 commercial device using single-event effects criticality and goal structuring notation.
This study was undertaken to determine the single event effect (SEE) susceptibility of two different MOSFET components. Heavy-ion testing was conducted at the Lawrence Berkeley National Laboratory (LBNL) Berkeley Accelerator Space Effects (BASE) Facility 88” Cyclotron. Its purpose was to evaluate these devices as candidates for use on Goddard Modular SmallSat Architecture (GMSA) adapter board for the GTOSat project.
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Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.
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This presentation includes NASA Electronic Parts and Packaging (NEPP) Program future approaches, Radiation Hardness Assurance (RHA) examples.
Total ionizing dose and displacement damage testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
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This paper presents the development and testing of the Software Define Radio (SDR) transceiver to meet the emerging needs for SmallSat communication and navigation. Vulcan Wireless and NASA Goddard Space Flight Center (GSFC) collaborated in testing the Vulcan Wireless S-band SDR engineering model. Apart from testing, communication link analysis was performed for a Low Earth Orbit (LEO) 400 km scenario. The results of the compatibility, radiation, environmental testing, and link analysis are presented. Also, this paper reviews a set of SmallSat missions under development at NASA GSFC.
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