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Meydbray, Jenya

Publications and source records attributed to Meydbray, Jenya.

6 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2023

Trends in Field and Laboratory Performance of Photovoltaic Modules and Materials

This DuraMAT project intends to identify bill of materials (BOM) and/or process control measures for photovoltaic modules with representative failure modes as informed by accelerated and field tests to guide next steps in module and material design. We have begun work to identify correlation between module field performance and accelerated testing results by cross-comparing a module database of accelerated test results with a module database of fielded systems. We have identified fielded systems with degraded performance, and intend to compare this to the results observed in certification and qualification testing. We also intend to apply lessons and observations from accelerated tests to the field, where it may be possible to mitigate or avoid degradation in the field.

DuraMAT↗
DOE OSTI2021

UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing

Fast, non-destructive, outdoor-compatible methods for photovoltaic module characterization are essential for monitoring module quality without disrupting energy production. UV-fluorescence (UVF) imaging of the encapsulant layer can be used for crack detection in the field. We show that UVF patterns vary widely between modules and types of applied stress. We propose that combining accelerated stress testing (e.g. thermal cycling and damp heat) with field investigations can help build understanding of different types of UVF, which are formed and subsequently quenched at varying rates. Ultimately, such understanding could enable estimating when cracks were formed.

41 EE - Solar Energy Technologies Office (EE-4S)↗
DOE OSTI2020

bifiPV2020 Bifacial Workshop: A Technology Overview

The virtual bifiPV Workshop was held in July 2020 to provide the solar industry with a forum for sharing and discussing research into bifacial photovoltaic (PV) technology. This report outlines major insights from the workshop to give the reader an overview of the latest developments in bifacial PV technology worldwide, from the lab to the field. Citations are drawn from this workshop unless otherwise noted, with all proceedings available online at bifipvworkshop. com. Presentations for the bifiPV2020 Workshop focused on the following areas: bifacial power plant modeling and simulation, albedo improvements, the development of encapsulants, the durability and reliability of current bifacial technologies, performance comparisons between glass-glass and glass-transparent backsheet configurations, the future of passivated emitter and rear contact (PERC) solar cells, and the growing adoption of n-type solar cells. With 650 GW total PV installed worldwide and 1 TW to come very soon, PERC is now the standard PV cell type produced en masse. However, it is already reaching 23% efficiency, the upper limit for this type of technology. PV modules breaking the 0.5-kW barrier are starting to appear, and the costs of standard PERC technology are already below 0.2 USD/Wp. In 2019, five GW of bifacial PV were installed worldwide. In 2020, the majority of bifacial installations are expected to be located in the United States, China, and Middle East and North Africa (MENA) states. N-type bifacial technologies are becoming increasingly viable and have huge potential to dominate the market in the coming years. With bifacial technology mounted on horizontal single-axis trackers (HSAT), bids below 10 USD/MWh will soon be observed in the MENA region, and later in Chile and the United States. Factory audits and reliability testing can reduce field failures by helping buyers to select producers that follow rigorous quality assurance and quality control processes.

14 SOLAR ENERGY↗
DOE OSTI2020

bifiPV2020 Bifacial Workshop: A Technology Overview

The virtual bifiPV Workshop was held in July 2020 to provide the solar industry with a forum for sharing and discussing research into bifacial photovoltaic (PV) technology. This report outlines major insights from the workshop to give the reader an overview of the latest developments in bifacial PV technology worldwide, from the lab to the field. Citations are drawn from this workshop unless otherwise noted. Presentations for the bifiPV2020 Workshop focused on the following areas: bifacial power plant modeling and simulation, albedo improvements, the development of encapsulants, the durability and reliability of current bifacial technologies, performance comparisons between glass-glass and glass-transparent backsheet configurations, the future of passivated emitter and rear contact (PERC) solar cells, and the growing adoption of n-type solar cells. With 650 GW total PV installed worldwide and 1 TW to come very soon, PERC is now the standard PV cell type produced en masse. However, it is already reaching 23% efficiency, the upper limit for this type of technology. PV modules breaking the 0.5-kW barrier are starting to appear, and the costs of standard PERC technology are already below 0.2 USD/Wp. In 2019, five GW of bifacial PV were installed worldwide. In 2020, the majority of bifacial installations are expected to be located in the United States, China, and Middle East and North Africa (MENA) states. N-type bifacial technologies are becoming increasingly viable and have huge potential to dominate the market in the coming years. With bifacial technology mounted on horizontal single-axis trackers (HSAT), bids below 10 USD/MWh will soon be observed in the MENA region, and later in Chile and the United States. Factory audits and reliability testing can reduce field failures by helping buyers to select producers that follow rigorous quality assurance and quality control processes.

14 SOLAR ENERGY↗
DOE OSTI2020

Dark Lock-in Thermography Identifies Solder Bond Failure as the Root Cause of Series Resistance Increase in Fielded Solar Modules

Correlating the electrical performance of photovoltaic modules to the spatially resolved photoluminescence, electroluminescence, and dark lock-in thermography (DLIT) images is an important long-term goal for developing solar cell technology. These images offer highly sophisticated and detailed information about the spatial distribution and (if imaged at successive time intervals) temporal degradation of local series and shunt resistances. There have been extensive studies to correlate these imaging techniques to local characteristics at the cell level. However, it has been difficult to extract and quantify module-level information from the techniques. In this study, we interpret module current-voltage (I-V) measurements along with corresponding DLIT images within a module-scale simulation framework, demonstrating that series resistance degradation of the module I-V characteristics, in this case, can be attributed to solder bond failures. Our simulations highlight how current crowding associated with a failed solder joint (or a section of the solder pad) translates to the characteristic point-like (asymmetric doublet) heating pattern in neighboring solder joints (or the neighboring regions of the solder pad). Overall, the correlation between series resistance and solder joint degradation could inform expedited diagnosis of field degradation of solar modules.

42 ENGINEERING↗