Engineering topics
McClure, S.
Publications and source records attributed to McClure, S..
Europa Clipper: Selection and Characterization of Electronic Parts and Materials for the Europa Clipper Mission
No abstract available
Statistical Model Selection for TID Hardness Assurance
Radiation Hardness Assurance (RHA) methodologies against Total Ionizing Dose (TID) degradation impose rigorous statistical treatments for data from a part's Radiation Lot Acceptance Test (RLAT) and/or its historical performance. However, no similar methods exist for using "similarity" data - that is, data for similar parts fabricated in the same process as the part under qualification. This is despite the greater difficulty and potential risk in interpreting of similarity data. In this work, we develop methods to disentangle part-to-part, lot-to-lot and part-type-to-part-type variation. The methods we develop apply not just for qualification decisions, but also for quality control and detection of process changes and other "out-of-family" behavior. We begin by discussing the data used in ·the study and the challenges of developing a statistic providing a meaningful measure of degradation across multiple part types, each with its own performance specifications. We then develop analysis techniques and apply them to the different data sets.
Catastrophic SEE in high-voltage power MOSFETs
Heavy ion irradiation of high-voltage power MOSFETs with long-range ions was performed using 14, 19, 22, 24, 28 and 39 MeV-cm2/mg ions.
Memories in space: the challenge of the real world
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Total dose performance of radiation hardened voltage regulators and references
Total dose test of commercially available radiation hardened bipolar voltage regulators and references show reduced sensitivity to dose rate and varying sensitivity to bias under pressure. Behavior of critical parameters in different dose rate and bias conditions is compared and the impact to hardness assurance methodology is discussed.
A NASA approach to ELDRS in linear devices
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Dose rate and bias dependency of total dose sensitivity of low dropout voltage regulators
Total dose tests of six different low dropout voltage regulators show sensitivity to both dose rate and bias during exposure. All devices tested exhibited Enhanced Low Dose Rate Sensitivity (ELDRS) and performed worse for the unbiased irradiation condition. Behavior of critical parameters in different dose rate and bias conditions is compared and the impact to hardness assurance methodology is discussed.
Continuing radiation evaluation of commercial-off-the-shelf devices for space applications
Radiation test results are presented for a number of commercial transistors and integrated circuits procured in both ceramic and plastic packages.