Engineering topics
Publications and source records attributed to Martin, M..
Laser machine scans wafers for contaminating particles which cause open circuits, short circuits, and other defects in integrated circuits and transfers good wafers to integrated circuit processing equipment. Machine is faster and more accurate than human operator using lightfield/dark field microscope.
The system performance test software is currently being modified to include additional capabilities and enhancements. Additional software programs are currently being developed for the Command Store and Forward System and the Automatic Total Recall System. The test executive is the main program. It controls the input and output of the individual test programs by routing data blocks and operator directives to those programs. It also processes data block dump requests from the operator.
Program uses minimal core and time resources and performs following analysis functions: artwork verification, device identification, nodal analysis, capacitance calculation, and logic equation generation. For data base simplicity, program processing operates on mask data which has been coverted from its original form to orthogonal rectangles.
Basic math model study of planetary quarantine effects on Voyager Mars mission
Charged pion production by proton beam incidence on elements from beryllium to lead