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Lin, T.

Publications and source records attributed to Lin, T..

Operational Aspects of Space Radiation Analysis

Minimizing astronaut's short and long-term medical risks arising from exposure to ionizing radiation during space missions is a major concern for NASA's manned spaceflight program, particularly exploration missions. For ethical and legal reasons, NASA follows the "as low as reasonably achievable" (ALARA) principal in managing astronaut's radiation exposures. One implementation of ALARA is the response to space weather events. Of particular concern are energetic solar particle events, and in low Earth orbit (LEO), electron belt enhancements. To properly respond to these events, NASA's Space Radiation Analysis Group (SRAG), in partnership with the NOAA Space Environment Center (SEC), provides continuous flight support during U.S. manned missions. In this partnership, SEC compiles space weather data from numerous ground and space based assets and makes it available in near real-time to SRAG (along with alerts and forecasts), who in turn uses these data as input to models to calculate estimates of the resulting exposure to astronauts. These calculations and vehicle instrument data form the basis for real-time recommendations to flight management. It is also important to implement ALARA during the design phase. In order to appropriately weigh the risks associated with various shielding and vehicle configuration concepts, the expected environment must be adequately characterized for nominal and worst case scenarios for that portion of the solar cycle and point in space. Even with the best shielding concepts and materials in place (unlikely), there will be numerous occasions where the crew is at greater risk due to being in a lower shielded environment (short term transit or lower shielded vehicles, EVAs), so that accurate space weather forecasts and nowcasts, of particles at the relevant energies, will be crucial to protecting crew health and safety.

Weyland, M. D.↗

Infrared Detectors Reach New Lengths

Infrared detectors operating from mid IR wavelengths to very long wavelength IR are of great interest for a variety of ground based and space based applications such as night vision, early warning systems, navigation, flight control systems, weather monitoring, and astronomy.

infrared detectors↗

Photoresponse Model for Si_(1-x)Ge_x/Si Heterojunction Internal Photoemission Infrared Detector

A photoresponse model has been developed for the Si_(1-x)Ge_x/Si heterojunction internalphotoemission (HIP) infrared detector at wavelengths corresponding to photon energies less than theFermi energy. A Si_(0.7)Ge_(0.3)/Si HIP detector with a cutoff wavelength of 23 micrometers andan emission coefficient of 0.4 eV^(-1) has been demonstrated. The model agrees with the measureddetector response at lambda greater than 8 micrometers. The potential barrier determined by themodel is in close agreement (difference similar to 4 meV) with the potential barrier determined by theRichardson plot, compared to the discrepancies of 20-50 meV usually observed for PtSi Schottkydetectors.

Lin, T.↗

Long-Wavelength PtSi Infrared Detectors Fabricated by Incorporating a P+ Doping Spike Grown by Molecular Beam Epitaxy

By incorporating a 1-nm-thick p+ doping spike at the PtSi/Si interface, we have successfullydemonstrated extended cutoff wavelengths of PtSi Schottky infrared detectors in the long wavelengthinfrared (LWIR) regime for the first time. The extended cutoff wavelengths resulted from thecombined effects of an increased electric field near the silicide/Si interface due to the p+ dopingspike and the Schottky image force. The p+ doping spikes were grown by molecular bema epitaxy at450 degrees C using elemental boron as the dopant source, with doping concentrations ranging from 5x 10^(19) to 2 x 10^(20) cm^(-3). Transmission electron microscopy indicated good crystallinequality of the doping spikes. The cutoff wavelengths were shown to increase with increasing dopingconcentrations of the p+ spikes. Thermionic emission dark current characteristics were observed andphotoresponse in the LWIR regime was demonstrated.

Maserjian, J.↗

Tailorable Doping-Spike PtSi Infrared Detectors Fabricated by Si Molecular Beam Epitaxy

By incorporating a 1-nm-thick p+ doping spike at the PtSi/Si interface, we have successfullydemonstrated extended cutoff wavelengths of PtSi Schottky infrared detectors. The extended cutoffwavelengths resulted from the reduced effective potential barriers due to the combined effects of anincreased electric field near the silicide/Si interface and the Schottky image force. The p+ dopingspikes were grown by molecular beam epitaxy at 450 degrees C using elemental boron as the dopantsource, with doping concentrations ranging from 5 x 10^(19) to 2 x 10^(20) cm^(-3). The cutoffwavelengths were shown to increase with increasing doping concentrations of the p+ spikes. Thermionic emission dark current characteristics were observed and photoresponse in the LWIRregime was demonstrated. Furthermore, the effective potential barriers determined by the Richardsonplots were used to study the electrically activated boron dopant concentrations of the thin (1-nm-thick) spikes.

del Castillo, H. M.↗

Neural net diagnostics for VLSI test

This paper discusses the application of neural network pattern analysis algorithms to the IC fault diagnosis problem. A fault diagnostic is a decision rule combining what is known about an ideal circuit test response with information about how it is distorted by fabrication variations and measurement noise. The rule is used to detect fault existence in fabricated circuits using real test equipment. Traditional statistical techniques may be used to achieve this goal, but they can employ unrealistic a priori assumptions about measurement data. Our approach to this problem employs an adaptive pattern analysis technique based on feedforward neural networks. During training, a feedforward network automatically captures unknown sample distributions. This is important because distributions arising from the nonlinear effects of process variation can be more complex than is typically assumed. A feedforward network is also able to extract measurement features which contribute significantly to making a correct decision. Traditional feature extraction techniques employ matrix manipulations which can be particularly costly for large measurement vectors. In this paper we discuss a software system which we are developing that uses this approach. We also provide a simple example illustrating the use of the technique for fault detection in an operational amplifier.

Lin, T.↗