Engineering topics
Publications and source records attributed to Leviton, Douglas B..
Optoelectronic pattern-recognition systems (optical encoders) for measuring positions of objects of interest at temperatures well below or well above room temperature are undergoing development. At present, the development effort is concentrated on absolute linear, rotary, and Cartesian encoders and Cartesian autocollimators for scientific instruments that operate in cryostats.
This invention presents a two-dimensional absolute optical encoder and a method for determining position of an object in accordance with information from the encoder. The encoder of the present invention comprises a scale having a pattern being predetermined to indicate an absolute location on the scale, means for illuminating the scale, means for forming an image of the pattern; and detector means for outputting signals derived from the portion of the image of the pattern which lies within a field of view of the detector means, the field of view defining an image reference coordinate system, and analyzing means, receiving the signals from the detector means, for determining the absolute location of the object. There are two types of scale patterns presented in this invention: grid type and starfield type.
The optical designs of future NASA infrared (IR) missions and instruments, such as the James Webb Space Telescope's (JWST) Near-Mixed Camera (NIRCam), will rely on accurate knowledge of the index of refraction of various IR optical materials at cryogenic temperatures. To meet this need, we have developed a Cryogenic, High-Accuracy Refraction Measuring System (CHARMS). In this paper we discuss the completion of the design and construction of CHARMS as well as the engineering details that constrained the final design and hardware implementation. In addition, we will present our first light, cryogenic, IR index of refraction data for LiF, BaF2, and CaF2, and compare our results to previously published data for these materials.
An absolute optical linear or rotary encoder which encodes the motion of an object (3) with increased resolution and encoding range and decreased sensitivity to damage to the scale includes a scale (5), which moves with the object and is illuminated by a light source (11). The scale carries a pattern (9) which is imaged by a microscope optical system (13) on a CCD array (17) in a camera head (15). The pattern includes both fiducial markings (31) which are identical for each period of the pattern and code areas (33) which include binary codings of numbers identifying the individual periods of the pattern. The image of the pattern formed on the CCD array is analyzed by an image processor (23) to locate the fiducial marking, decode the information encoded in the code area, and thereby determine the position of the object.
The Hubble Space Telescope (HST) Advanced Camera for Surveys (ACS) will employ a wide variety of spectral filtration components including narrow band, medium band, wide band, and far ultraviolet (FUV) long pass filters, spatially- variable filters (ramp filters), VIS/IR polarizers, NUV polarizers, FUV prisms, and a grism. These components are spread across ACS's Wide Field, High Resolution, and Solar Blind channels which provide diffraction-limited imaging of astronomical targets using aberration-correcting optics which remove most aberrations from HST's Optical Telescope Assembly (OTA). In order for ACS to be truly advanced, these filters must push the state-of-the-art in performance in a number of key areas at the same time. Important requirements which these filters must meet include outstanding transmitted wavefront, high transmittance, uniform transmittance across each filter, spectrally structure-free bandpasses, exceptionally high out of band rejection, and a high degree of parfocality. These constitute a very stringent set of requirements indeed, especially for filters which are up to 90 mm in diameter. The development of optical metrology stations used to demonstrate that each ACS filter will meet its design specifications is discussed. Of particular note are specially-designed spectral transmissometers and interferometers.
Refractive index measurements using the minimum deviation method have been carried out for prisms of a variety of far ultraviolet optical materials used in the manufacture of Solar Blind Channel (SBC) filters for the HST Advanced Camera for Surveys (ACS). Some of the materials measured are gaining popularity in a variety of high technology applications including high power excimer lasers and advanced microlithography optics operating in a wavelength region where high quality knowledge of optical material properties is sparse. Our measurements are of unusually high accuracy and precision for this wavelength region owing to advanced instrumentation in the large vacuum chamber of the Diffraction Grating Evaluation Facility (DGEF) at Goddard Space Flight Center (GSFC). Index values for CaF2, BaF2, LiF, and far ultraviolet grades of synthetic sapphire and synthetic fused silica are reported and compared with values from the literature.
Chemically-vapor-deposited (CVD) silicon carbide (SiC) has become a popular mirror material for spaceborne solar instrumentation for the vacuum ultraviolet wavelength range due to its appreciable broadband reflectance and favorable thermal and opto-mechanical properties. Scatter from surfaces of mirrors operating in this wavelength range can destroy otherwise good image contrast especially for extended targets such as the sun. While visible light scatter measurements are relatively easy to conduct, far ultraviolet (FUV) scatter measurements are not so easy. Visible light (633 nm) scatter measurements were performed on CVD SiC telescope mirrors (from the same vendor) for two instruments on the Solar and Heliospheric Observatory (SOHO) -- Ultraviolet Coronagraph Spectrometer (UVCS) and Solar Ultraviolet Measurement of Emitted Radiation (SUMER). Additionally, extensive FUV scatter measurements were made for SUMER telescope mirrors. We attempt to correlate the results for those visible light scatter measurements and to explore the usefulness of visible scatter measurements to predictions of FUV scatter for this important material.
Several new types of absolute optical encoders of both rotary and linear function are discussed. The means for encoding are complete departures from conventional optical encoders and offer advantages of compact form, immunity to damage-induced dropouts of position information, and about an order of magnitude higher sensitivity over what is commercially available. Rotary versions have sensitivity from 0.02 arcseconds down to 0.003 arcsecond while linear models have sensitivity of 10 nm.
The focal shift of an optical filter used in non-collimated light depends directly on substrate thickness and index of refraction. The HST Advanced Camera for Surveys (ACS) requires a set of filters whose focal shifts are tightly matched. Knowing the index of refraction for substrate glasses allows precise substrate thicknesses to be specified. Two refractometers have been developed at the Goddard Space Flight Center (GSFC) to determine the indices of refraction of materials from which ACS filters are made. Modem imaging detectors for the near infrared, visible, and far ultraviolet spectral regions make these simple yet sophisticated refractometers possible. A new technology, high accuracy, angular encoder also developed at GSFC makes high precision index measurement possible in the vacuum ultraviolet.
Advanced optical bandpass filters for the Hubble Space Telescope (HST) Advanced Camera for Surveys (ACS) have been developed on a filter-by-filter basis through detailed studies which take into account the instrument's science goals, available optical filter fabrication technology, and developments in ACS's charge-coupled-device (CCD) detector technology. These filters include a subset of filters for the Sloan Digital Sky Survey (SDSS) which are optimized for astronomical photometry using today's charge-coupled-devices (CCD's). In order for ACS to be truly advanced, these filters must push the state-of-the-art in performance in a number of key areas at the same time. Important requirements for these filters include outstanding transmitted wavefront, high transmittance, uniform transmittance across each filter, spectrally structure-free bandpasses, exceptionally high out of band rejection, a high degree of parfocality, and immunity to environmental degradation. These constitute a very stringent set of requirements indeed, especially for filters which are up to 90 mm in diameter. The highly successful paradigm in which final specifications for flight filters were derived through interaction amongst the ACS Science Team, the instrument designer, the lead optical engineer, and the filter designer and vendor is described. Examples of iterative design trade studies carried out in the context of science needs and budgetary and schedule constraints are presented. An overview of the final design specifications for the ACS bandpass and ramp filters is also presented.
A device for position encoding of a rotating shaft in which a polygonal mirror having a number of facets is mounted to the shaft and a monochromatic light beam is directed towards the facets. The facets of the polygonal mirror direct the light beam to a stand-alone low line density diffraction grating to diffract the monochromatic light beam into a number of diffracted light beams such that a number of light spots are created on a linear array detector. An analog-to-digital converter is connected to the linear array detector for reading the position of the spots on the linear array detector means. A microprocessor with memory is connected to the analog-to-digital converter to hold and manipulate the data provided by the analog-to-digital converter on the position of the spots and to compute the position of the shaft based upon the data from the analog-lo-digital converter.
A device for positioning encoding of a rotating shaft in which a polygonal mirror having a number of facets is mounted to the shaft and a light beam is directed towards the facets. The facets of the polygonal mirror reflect the light beam such that a light spot is created on a linear array detector. An analog-to-digital converter is connected to the linear array detector for reading the position of the spot on the spots on the linear array detector. A microprocessor with memory is connected to the analog-to-digital converter to hold and manipulate the data provided by the analog-to-digital converter on the position of the spot and to compute the position of the shaft based upon the data from the analog-to-digital converter.
Improved optoelectronic encoder measures absolute angle to which shaft has been rotated. Costs little more than older, less capable encoders do, yet measures absolute angles at high resolution and does not lose absolute-angle data because generates those data anew with each reading at up to 1,000 times per second. It accumulates increments to measure total angular interval through which shaft has been turned (including unlimited number of complete turns), as long as power remains on.
Conventional silicon micromachining techniques produce micrometer-sized rectangular apertures. Used to define source and detector openings for measurements of images and scattered light in visible, ultraviolet, and soft x-ray wavelength regions, and as general-purpose optical slits or slit arrays. Rectangular microscopic apertures replace circular pinholes made by puncturing foils with needles or by drilling foils with intense, highly-focused laser beams. Precise photolithography yields apertures of superior geometry.
A device for position encoding of a rotating shaft in which a polygonal mirror having a number of facets is mounted to the shaft and a monochromatic light beam is directed towards the facets. The facets of the polygonal mirror each have a low line density diffraction grating to diffract the monochromatic light beam into a number of diffracted light beams such that a number of light spots are created on a linear array detector. An analog-to-digital converter is connected to the linear array detector for reading the position of the spots on the linear array detector means. A microprocessor with memory is connected to the analog-to-digital converter to hold and manipulate the data provided by the analog-to-digital converter on the position of the spots and to compute the position of the shaft based upon the data from the analog-to-digital converter.
A Linear Motion Encoding device for measuring the linear motion of a moving object is disclosed in which a light source is mounted on the moving object and a position sensitive detector such as an array photodetector is mounted on a nearby stationary object. The light source emits a light beam directed towards the array photodetector such that a light spot is created on the array. An analog-to-digital converter, connected to the array photodetector is used for reading the position of the spot on the array photodetector. A microprocessor and memory is connected to the analog-to-digital converter to hold and manipulate data provided by the analog-to-digital converter on the position of the spot and to compute the linear displacement of the moving object based upon the data from the analog-to-digital converter.
A device for position encoding of a rotating shaft in which a polygonal mirror having a number of facets is mounted to the shaft and a light beam is directed towards the facets is presented. The facets of the polygonal mirror reflect the light beam such that a light spot is created on a linear array detector. An analog-to-digital converter is connected to the linear array detector for reading the position of the spot on the linear array detector. A microprocessor with memory is connected to the analog-to-digital converter to hold and manipulate the data provided by the analog-to-digital converter on the position of the spot and to compute the position of the shaft based upon the data from the analog-to-digital converter.
An engineering model intensified CCD detector for the SOHO Coronal Diagnostics Spectrometer has been built and tested at the NASA Goddard Space Flight Center. A windowless MCP intensifier tube converts EUV radiation (30-65 nm) into visible light, which is focused via a lens system onto a Tektronix 1024 x 1024 CCD. Tests have been made of this engineering model to determine the following characteristics: quantum efficiency, resolution, throughput, linearity, statistical variation, readout noise, scattering, and flat-field response. In almost all respects, the detector performed as expected. This detector has been delivered, and work is underway on the flight detector.