Lee, Yonghoon

Binary classification with noisy quantum circuits and noisy quantum data

We study the effects of single-qubit noises in the quantum circuit and the corruption in the quantum training data to the performance of binary classification problem. We find that under the presence of errors, the measurement at a qubit is affected only by the noise in the corresponding qubit, and that the errors on other qubits do not affect this outcome. Furthermore, for the task where we fit a binary classifier using a quantum training data, we show that the noise in the data can work as a regularizer, implying that we can benefit from the noise in certain cases. We support our findings with simulations.