Engineering topics
Lauer, Kenneth
Publications and source records attributed to Lauer, Kenneth.
Hard x-ray nanoprobe facility at the National Synchroton Light Source II
The Hard X-ray Nanoprobe (HXN) Beamline [1] of the National Synchrotron Light Source II (NSLS-II) is now available for general user experiments. This beamline was developed with the world’s most ambitious resolution goal for hard x-rays. Its initial performance target is to enable x-ray imaging experiments at a resolution of 10 nm, with an ultimate goal of reaching ~1 nm.
Achieving Hard X-ray Nanofocusing Using a Wedged Multilayer Laue Lens
Here, we report on the fabrication and the characterization of a wedged multilayer Laue lens for x-ray nanofocusing. The lens was fabricated using a sputtering deposition technique, in which a specially designed mask was employed to introduce a thickness gradient in the lateral direction of the multilayer. X-ray characterization shows an efficiency of 27% and a focus size of 26 nm at 14.6 keV, in a good agreement with theoretical calculations. Our results indicate that the desired wedging is achieved in the fabricated structure. Furthermore, we anticipate that continuous development on wedged MLLs will advance x-ray nanofocusing optics to new frontiers and enrich capabilities and opportunities for hard X-ray microscopy.
Performance and characterization of a MEMS-based device for alignment and manipulation of x-ray nanofocusing optics
Not Available
A High-Precision Instrument for Mapping of Rotational Errors in Rotary Stages
A rotational stage is a key component of every X-ray instrument capable of providing tomographic or diffraction measurements. To perform accurate three-dimensional reconstructions, runout errors due to imperfect rotation (e.g. circle of confusion) must be quantified and corrected. A dedicated instrument capable of full characterization and circle of confusion mapping in rotary stages down to the sub-10 nm level has been developed. A high-stability design, with an array of five capacitive sensors, allows simultaneous measurements of wobble, radial and axial displacements. The developed instrument has been used for characterization of two mechanical stages which are part of an X-ray microscope.