Engineering topics

Lala, P. K.

Publications and source records attributed to Lala, P. K..

3 records

NASA NTRS2001

A Step Response Based Mixed-Signal BIST Approach for Continuous-time Linear Circuits

A new Mixed-Signal Built-in self-test approach that is based upon the step response of a reconfigurable (or multifunction) analog block is presented in this paper. The technique requires the overlapping step response of the Circuit Under Test (CUT) for two circuit configurations. Each configuration can be realized by changing the topology of the CUT or by sampling two CUT nodes with differing step responses. The technique can effectively detect both soft and hard faults and does not require an analog-to-digital converter (ADC) and/or digital-to-analog converter(DAC). It also does not require any precision voltage sources or comparators. This approach does not require any additional analog circuits to realize the test signal generator and sample circuits. The paper is concluded with the application of the proposed approach to a circuit found in the work of Epstein et al and two ITC 97 analog benchmark circuits.

Walker, Alvernon↗

NASA NTRS1997

Off-Line Testing for Bridge Faults in CMOS Domino Logic Circuits

Bridge faults, especially in CMOS circuits, have unique characteristics which make them difficult to detect during testing. This paper presents a technique for detecting bridge faults which have an effect on the output of CMOS Domino logic circuits. The faults are modeled at the transistor level and this technique is based on analyzing the off-set of the function during off-line testing.

Bennett, K.↗

NASA NTRS1993

Self-checking sequential circuit design using m-out-of-n codes

A technique for designing sequential circuits which are totally self-checking for single stuck at faults is presented. This technique uses m-out-of-n codes for state assignments and for output encoding. The next stage logic and the output logic are implemented such that any stuck-at-fault will either create a single bit error or unidirectional multibit error at the output. The technique has been applied to MCNC benchmark circuits and the overhead is estimated.

Busaba, F. Y.↗