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LaBel, Kenneth A.

Publications and source records attributed to LaBel, Kenneth A..

At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS2018

Protons, Aerospace, and Electronics: A National Interest

The aerospace and semiconductor industries lost approximately 2000 hours annually of research access when IUCF closed. An ad hoc team between the U.S. government and industry was formed to evaluate other facility options. In this presentation, we will discuss: 1) Why aerospace, semiconductor manufacturers, and others are interested in proton facility access, as well as, 2) Some of the basics of a typical tests for electronics, and 3) We'll conclude with the brief current status on progress.

Parts assurance↗
NASA NTRS2017

Why NASA and the Space Electronics Community Cares About Cyclotrons

NASA and the space community are faced with the harsh reality of operating electronic systems in the space radiation environment. Systems need to work reliably (as expected for as long as expected) and be available during critical operations such as docking or firing a thruster. This talk will provide a snapshot of the import of ground-based research on the radiation performance of electronics. Discussion topics include: 1) The space radiation environment hazard, 2) Radiation effects on electronics, 3) Simulation of effects with cyclotrons (and other sources), 4) Risk prediction for space missions, and, 5) Real-life examples of both ground-based testing and space-based anomalies and electronics performance. The talk will conclude with a discussion of the current state of radiation facilities in North America for ground-based electronics testing.

Risk prediction↗
NASA NTRS2017

Electrical, Electronic and Electromechanical (EEE) Parts in the New Space Paradigm: When is Better the Enemy of Good Enough?

As the space business rapidly evolves to accommodate a lower cost model of development and operation via concepts such as commercial space and small spacecraft (aka, CubeSats and swarms), traditional EEE parts screening and qualification methods are being scrutinized under a risk-reward trade space. In this presentation, two basic concepts will be discussed: (1) The movement from complete risk aversion EEE parts methods to managing and/or accepting risk via alternate approaches; and, (2) A discussion of emerging assurance methods to reduce overdesign as well emerging model based mission assurance (MBMA) concepts. center dot Example scenarios will be described as well as consideration for trading traditional versus alternate methods.

LaBel, Kenneth A.↗
NASA NTRS2017

The NASA Electronic Parts and Packaging (NEPP) Program - NASA Items of Interest

This presentation provides a background summary of the NEPP Program, its origins and operating principles followed by examples of issues and opportunities that NEPP is currently pursuing. These examples include Electrostatic Discharge protection procedures that are not being properly applied, one reason for which is the confusion caused by the numerous, different standards covering this topic. Updates are provided for key activities in radiation hardness assurance, and the evaluation of automotive grade electronic parts for use in space applications. Some recent examples of part problems experienced by NASA are briefly described and the latest trending of incidences of counterfeit electronic parts is shown graphically. Finally some forward actions are identified and the time, place and typical topics is provided for the next NEPP Electronic Technology Workshop (ETW).

Electrical Electronic and Electromechanical (EEE)↗
NASA NTRS2017

NASA Past, Present, and Future: The Use of Commercial Off The Shelf (COTS) Electronics in Space

NASA has a long history of using commercial grade electronics in space. In this presentation we will provide a brief history of NASA's trends and approaches to commercial grade electronics focusing on processing and memory systems. This will include providing summary information on the space hazards to electronics as well as NASA mission trade space. We will also discuss developing recommendations for risk management approaches to Electrical, Electronic and Electromechanical (EEE) parts usage in space. Two examples will be provided focusing on a near-earth Polar-orbiting spacecraft as well as a mission to Mars. The final portion will discuss emerging trends impacting usage.

Commercial off the Shelf (COTS); Electronic and El↗
NASA NTRS2017

Challenges Regarding IP Core Functional Reliability

For many years, intellectual property (IP) cores have been incorporated into field programmable gate array (FPGA) and application specific integrated circuit (ASIC) design flows. However, the usage of large complex IP cores were limited within products that required a high level of reliability. This is no longer the case. IP core insertion has become mainstream including their use in highly reliable products. Due to limited visibility and control, challenges exist when using IP cores and subsequently compromise product reliability. We discuss challenges and suggest potential solutions to critical application IP insertion.

IP cores↗
NASA NTRS2016

Electrical, Electronic and Electromechanical (EEE) Parts in the New Space Paradigm: When is Better the Enemy of Good Enough?

As the space business rapidly evolves to accommodate a lower cost model of development and operation via concepts such as commercial space and small spacecraft (aka, CubeSats), traditional EEE parts screening and qualification methods are being scrutinized under a risk-reward trade space. In this presentation, two basic concepts will be the overarching theme: 1) The movement from complete risk aversion EEE parts methods to managing and/or accepting risk via alternate approaches; and, 2) A discussion of over-design focusing on both electrical design performance and bounding margins.

Small spacecraft↗
NASA NTRS2016

The NASA Electronic Parts and Packaging (NEPP) Program: An Overview

This presentation provides an overview of the NEPP Program. The NEPP Mission is to provide guidance to NASA for the selection and application of microelectronics technologies; Improve understanding of the risks related to the use of these technologies in the space environment; Ensure that appropriate research is performed to meet NASA mission assurance needs. NEPP's Goals are to provide customers with appropriate and cost-effective risk knowledge to aid in: Selection and application of microelectronics technologies; Improved understanding of risks related to the use of these technologies in the space environment; Appropriate evaluations to meet NASA mission assurance needs; Guidelines for test and application of parts technologies in space; Assurance infrastructure and support for technologies in use by NASA space systems.

Technology Evaluation↗
NASA NTRS2016

Reliable Design Versus Trust

This presentation focuses on reliability and trust for the users portion of the FPGA design flow. It is assumed that the manufacturer prior to hand-off to the user tests FPGA internal components. The objective is to present the challenges of creating reliable and trusted designs. The following will be addressed: What makes a design vulnerable to functional flaws (reliability) or attackers (trust)? What are the challenges for verifying a reliable design versus a trusted design?

Field Programmable Gate Aray (FPGA)↗