Contamination of MOS field effect transistors.
Positive ion current emission by tungsten and molybdenum studied for influence of impurities on MOSFET transistors
Engineering topics
Publications and source records attributed to Hoenig, S. A..
Positive ion current emission by tungsten and molybdenum studied for influence of impurities on MOSFET transistors
Explore the source record for details and available documents.
Surface ionization detector of hydrogen in presence of air at one atm
High temperature vacuum furnace using electric furnace parts
Liquid nitrogen-cooled shield against oil vapor contamination of proton accelerator in vacuum chamber
Change in thermionic emission current of palladium wire at 1000 degrees C due to exposure to molecular and atomic-hydrogen beams
Physical methods description for detection and analysis of tenuous planetary atmospheric component gases, especially water vapor
Chemisorption detector for hydrogen using palladium filament under high vacuum conditions
Oxygen detector which operates by chemisorption and desorption from tungsten filament in high vacuum