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Heaney, J. B.

Publications and source records attributed to Heaney, J. B..

At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1988

Polarization of microwave noise source radiation in the 30 GHz to 300 GHz range

Radiation spectra have been obtained in order to calculate the frequency bandwidth and polarization of three microwave noise sources. Results were obtained in the 1-10-mm wavelength region using a lamellar grating Fourier transform spectrometer and a helium-cooled bolometer detector. A secondary transmission region was found to have an input current as well as a polarization dependence, despite the directional output of the waveguide antenna.

Poutous, M. K.↗
NASA NTRS1987

A spectral radiance comparison of a noise tube and a HgXe arc lamp between 60 GHz and 600 GHz

The relative spectral radiance of a noise tube, model TN-167, designed for the frequency range 90-140 GHz (3.3 mm to 2.1 mm) was compared to that from a 200-watt high pressure HgXe arc lamp over the wavelength region from 0.5 to about 5 mm. A Michelson Fourier transform spectrometer and a lamellar grating instrument were used in conjunction with liquid helium-cooled bolometers of NEP 10 to the -12th to 10 to the -14th watt/(Hz) exp 1/2 to measure relative spectral radiant power. With this instrumental arrangement, the noise tube exhibited a very sharp low frequency cutoff at about 2.2/cm. The HgXe arc lamp emitted more radiant power than the noise tube in the wavelength region below 3 mm (100 GHz) down to 0.5 mm. Above 3 mm, the noise tube had a stronger output. The noise tube spectral radiance shifted to lower frequencies when the input current was lowered from 125 mA to 50 mA.

Heaney, J. B.↗
NASA NTRS1983

Transmittance and reflectance of crystalline quartz and highand low-water content fused silica from 2 microns to 1 mm

The transmittances and reflectances of cultured crystalline quartz, Suprasil, Suprasil W, and Infrasil were compared over the wavelength region from 2 to 1000 microns. The high-water content of Suprasil and the low-water content of cultured crystalline quartz, Suprasil W, and Infrasil were determined by their transmittances measured at 2.73 microns where water content causes high absorption in optical materials. The fact that the fused silicas, both with high- and low-water content, had identical far-IR transmittances and that their transmittances were greatly inferior to that of crystalline quartz led to the conclusion that their inferior transmittance is due to their amorphous structure and not to their water content.

Heaney, J. B.↗
NASA NTRS1980

Effect of UV irradiation on evaporated ZnS films

Evaporated ZnS films used as a component in reflectance enhancing or decreasing multilayer coatings for mirrors, transparent optical materials, and vacuum UV reflecting optics, are investigated with reference to the reflectance loss under UV irradiation and the formation of ZnO as a result of the decomposition of ZnS in the presence of oxygen. Reflectance measurements over a broad wavelength range reveal that the UV induced reflectance losses are generally restricted to wavelengths shorter than 4000 A and are most severe in the vacuum UV region. After 134 hr of UV exposure initially polycrystalline film of 150-200 A thick is completely converted to amorphous ZnO. The results demonstrate that caution should be exercised in employing ZnS as the outer layer in an optical coating system designed for use in the UV and vacuum UV regions.

Hass, G.↗
NASA NTRS1979

Transparent electrically conducting thin films for spacecraft temperature control applications

Thin transparent films of In2O3 or In2O3 + SnO2 prepared by evaporation or sputtering have been tested for use as surface layers for spacecraft temperature control coatings. The films are intended to prevent nonuniform electric charge buildup on the spacecraft exterior. Film thicknesses of 300 to 500 A were found to be optimal in terms of durability and minimum impact on the solar absorptance and the thermal emissivity of the underlayers. As a verification of their suitability for long-duration space missions, the films were subjected to simulated solar UV plus proton irradiation in a vacuum.

Hass, G.↗
NASA NTRS1978

Coatings in space environment

The behavior in space environment of evaporated Al uncoated and coated with reactively deposited silicon oxide (SiOx), electron beam evaporated SiO2 and Al2O3, and Al and Ag coated with double layers of Al2O3 + SiOx is compared with metallized Teflon and Kapton, anodized Al (Alzak), and white paints. Flight data from three calorimetric experiments and one reflectometer flown in different orbital environments are compared with laboratory test data. The results demonstrate that evaporated thin films are extremely versatile and stable coatings for space applications. Through the use of control samples studied in different laboratory tests and monitored for up to 12,000 hours of solar exposure in different orbits, a classification of orbital severity and an estimate of laboratory simulation accuracy is obtained.

Triolo, J. J.↗
NASA NTRS1977

Auger spectroscopic examination of MgF2-coated Al mirrors before and after UV irradiation

Magnesium fluoride protected Al films were studied since these mirrors are commonly used in astronomical instruments whenever a highly reflecting optical surface is required in the wavelength region from 1100 A to 2000 A. Freshly prepared samples of evaporated Al + 250-A thick MgF2 on glass were analyzed by Auger electron spectroscopy in conjunction with surface erosion by Ar(+) ion bombardment before and after UV irradiation. The analysis showed that a very thin layer of surface contamination and not bulk photolysis in the MgF2 film was reponsible for the irradiation-induced reflectance loss. Postirradiation polishing with a mild calcium carbonate abrasive can restore a mirror's reflectance by removing the photolyzed surface film without disturbing the MgF2 layer.

Heaney, J. B.↗
NASA NTRS1974

Evaluation of commercially supplied silver coated Teflon for spacecraft temperature control usage

A series of tests are described which were performed to evaluate the acceptability of a commercially supplied silver backed teflon thermal control coating relative to teflon previously coated at GSFC. Optical measurements made on numerous samples indicate that the commercial material possesses an average solar absorptance of 0.085, an emittance of 0.76 and an average alpha/epsilon equal to 0.112, all of which are equivalent to the GSFC coated teflon. The emittance of the protective inconel backing was found to be 0.037. The coating is shown to have good adhesion at the Ag-teflon interface and exposure to UV irradiation uncovered no coating irregularities. Temperature cycling over the range -135 C to +200 C produced crazing in the evaporated Ag layer as expected but no delamination was observed. The suitability of Mystik no. 7366 and 3M no. 467 adhesives as bonding agents for the metallized polymer is demonstrated. Various problems associated with production reproducibility and selection of a proper bonding process are discussed.

Heaney, J. B.↗
NASA NTRS1972

Observations on degradation of UV systems on Nimbus spacecraft

Broad band photometer experiments in the 1200 to 3000 A have been operating on Nimbus 3 and 4 since April 1969 for the purpose of determining the nature of variations in the UV solar irradiance. An Ebert-Fastie double monochromator has been measuring the solar irradiance and earth radiance from 2500 to 3400 A for the determination of global atmospheric ozone distributions since April 1970. From prelaunch testing and an evaluation of the flight data it is concluded that the principal source of degradation is probably the spacecraft. The degradation produces a characteristic signal loss and change in angular response of the system which might be explained by micron sized droplets becoming a permanent residue under the influence of solar UV radiation.

Heath, D. F.↗
NASA NTRS1971

A method of treating the non-grey error in total emittance measurements

In techniques for the rapid determination of total emittance, the sample is generally exposed to surroundings that are at a different temperature than the sample's surface. When the infrared spectral reflectance of the surface is spectrally selective, these techniques introduce an error into the total emittance values. Surfaces of aluminum overcoated with oxides of various thicknesses fall into this class. Because they are often used as temperature control coatings on satellites, their emittances must be accurately known. The magnitude of the error was calculated for Alzak and silicon oxide-coated aluminum and was shown to be dependent on the thickness of the oxide coating. The results demonstrate that, because the magnitude of the error is thickness-dependent, it is generally impossible or impractical to eliminate it by calibrating the measuring device.

Heaney, J. B.↗