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Gong, Datao

Publications and source records attributed to Gong, Datao.

2 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

The ETROC2 prototype for CMS MTD Endcap Timing Layer (ETL) upgrade

The ETROC2 prototype for CMS MTD Endcap Timing Layer (ETL) upgrade 520__ $$aThe Endcap Timing ReadOut Chip (ETROC) is designed to process LGAD signals with time resolution down to about 40-50ps per hit. The ETROC2 is the first full size (16x16) prototype design with the front-end based on and scaled up from the ETROC1 (4x4). The readout designs at pixel and global level and the system interfaces are all new and are compatible with the final chip specifications in terms of functionality. The ETROC2 is intended as a learning chip, as a stepstone to the ETROC3 which is intended as the pre-production design. The ETROC2 design and test results will be presented.

Gong, Datao↗
DOE OSTI2024

The Single Event Error (SEE) test and analysis of the CMS Endcap Timing Layer readout chip

The ETROC2, the first full size and full functionality prototype chip for the CMS Endcap Timing Layer readout, is strategically designed to meet the SEE immunity requirements of detector operation with the low power constraint. The triplicated periphery and pixel I2C configuration registers are designed with self-correction feature. The pixel readout control is centralized in the global readout and fully triplicated. The pixel readout is not triplicated, instead protected with power-efficient one-bit correction Hamming code. The TMR protection of the on-pixel threshold calibration can be turned off allowing the detection of the beam spot during the beam test by checking the bit-flips of the internal memory cells. In the initial proton beam test in January 2024, the chip readout process did not hang throughout the tests. The Hamming code correction strategy works because the error corrected TDC data were observed in the data frames. The error-injection simulation is performed to analy ze the small number of bit-flips in the configuration registers. We also performed SEE testing with a heavy ion beam in April and the data analysis is ongoing. The detailed design on the SEE immunity and the testing as well as simulation results will be presented, including follow-up SEE testing results in May and June 2024.

Gong, Datao↗