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Gaulding, Ashley (ORCID:0000000217721993)

Publications and source records attributed to Gaulding, Ashley (ORCID:0000000217721993).

Diagnosis of PV Cell Passivation Degradation Resulting from Hot-Humid, High Voltage Potential Aging

Corrosion of the antireflective coating on the cell ("AR c corrosion") was previously observed in studies using hot-humid test conditions with external high voltage (HV) bias. Because AR c corrosion is not well understood, mini-modules (MiMos) were examined in a comparative experiment using PERC and PERT as well as legacy Al-BSF cells. For separate MiMos with the cell circuit electrical at +1500 V, -1500 V, or unbiased "V oc", test conditions in the comparative study included 60degrees C/60% RH for 96 h, as in IEC TS 62804-1; 70degrees C/70%RH for 200 h; and 85degrees C/85% RH for 200 h. Characterizations at each read point included: camera and electroluminescence (EL) imaging, colorimetry, and I-V curve tracing. Characterizations at the final read point included: SunsVoc; spatially mapping external quantum efficiency (EQE); high resolution: photoluminescence (PL), EL, and dark lock-in thermographic (DLIT) imaging. Forensics were performed on extracted cores, including scanning electron microscopy (SEM) with energy-dispersive X-ray spectroscopy (EDS) and scanning Auger microscopy (SAM). Forensics were also conducted on MiMos (stepped HV aging) and full-sized modules (outdoor aging) from previous studies. AR c corrosion was specifically observed for the glass/encapsulant/cell side of +1500 V (HV+) stressed MiMos, where appearance, color, and reflectance were the characteristics most distinguished relative to simultaneously occurring degradation modes. SEM/EDS and SAM identified conversion of silicon nitride to silicon oxide or hydrous silica, preferentially occurring at the edges and tips of the pyramidal textured cell surface.

aging↗

Quantifying Energy Flows in PV Circularity Processes

As sustainable deployment and end-of-life management become a hot topic to timely address in the PV community, a dynamic comparative evaluation of the benefits of circular pathways such as reuse, and remanufacturing, recycling has not been performed holistically beyond material flows or LCA analysis. Energy flows are critical for evaluating energy generation technologies. Previously they have been used to compare renewables to fossil generation and then between PV technologies. This paper quantifies energy flows to evaluate circular pathways for PV. The energy flows tracking manufacturing, generation, and losses complementary to the mass flows of silicon are quantified leveraging the PV ICE framework.

circular economy↗

Quantifying Energy Flows in PV Circularity Processes: Preprint

As sustainability and end-of-life management become a hot topic to timely address in the PV community, a proper evaluation of the benefits of circular pathways such as recycling, reuse, and remanufacturing has not been performed holistically beyond material flows or LCA analysis. Energy flows are critical for evaluating energy generation technologies. Previously they have been used to compare renewables to fossil generation and then between PV technologies. This paper brings energy flows to bear on reaching circular pathways for PV. The energy flows to track energy usage, generation, and losses complementary to the mass flows are presented for silicon through the leverage of the PV ICE framework.

circular economy↗

LeTID-Affected Cells from a Utility-Scale Photovoltaic System Characterized by Deep Level Transient Spectroscopy

Photovoltaic modules from a utility-scale field experienced power loss by light- and elevated temperature-induced degradation (LeTID). Samples of one of the affected monocrystalline silicon cells were cored and extracted from the module packaging and encapsulation. One of the cell fragments was processed using a regeneration cycle of applying short-circuit-rated current in forward bias at 85 degrees C for 2 weeks, while the other fragment was kept in its outdoor-degraded LeTID state. Both samples were scribed to form 2-mm diameter isolated areas using a femtosecond-pulse-width laser micromachining system. Both isolated areas contained front grid line segments which were wire bonded to larger contact pads, and the samples were probed in a cryostat linked to a deep-level transient spectroscopy (DLTS) system. Using DLTS, a majority-carrier, hole-trap defect was detected on each sample with an activation energy of 0.42 eV. The LeTID-degraded sample, however, had a larger signal corresponding to a trap density of 1.1x10^13 cm-3, which was about five times larger than the 2.1x10^12 cm-3 trap density of the regenerated sample.

charge carrier lifetime↗