Charge Diffusion Measurement in Fully Depleted CCD Using X-rays
N/A
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
Engineering topics
Frank, J
Publications and source records attributed to Frank, J.
CCD Characterization and Measurements Automation
N/A
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
Lateral Diffusion Estimation in Fully Depleted Thick CCD Using Flat Field Image Analysis
In thick fully depleted CCDs charge carrier transport from the back window to the gates is accompanied by charge diffusion. Lateral diffusion smooths out density variations of the incoming photon flux by redistributing charges spatially. This creates short range positive correlations in recorded amplitudes. Pixel-to-pixel amplitude variations can also be caused by pixel size and quantum efficiency variations. Pixel size variations result in short range negative correlations. Our study shows that the characteristic diffusion width can be extracted from flat field data. The study was performed on fully depleted, thick CCDs produced in a technology study for the Large Synoptic Survey Telescope (LSST). Data were taken in the laboratory at bias voltages between -5 and -40 V. To increase statistical accuracy, images taken in identical conditions were co-added after base line subtraction and master files were produced. A flat field image simulator was developed for statistical comparison of simulated and measured images. Results on diffusion, pixel response variations, data features, analysis and modeling techniques are presented and discussed.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
Model-Independent Characterization of Charge Diffusion in Thick Fully Depleted CCDs
We present a new method to measure charge diffusion in charge-coupled devices (CCDs). The method is based on a statistical characterization of the shapes of charge clouds produced by low-energy X-rays using known properties of the two-dimensional Gaussian point-spread function (PSF). The algorithm produces reliable upper and lower bounds on the size of the PSF for photons converting near the entrance window of a device. It is optimally suited to the case of thick back-illuminated CCDs where the X-ray absorption length is smaller than the silicon thickness and the diffusion scale is of the same order as the pixel size. The only assumptions are that the charge cloud width is a monotonically increasing function of distance from the conversion point to the buried channel, and that the conversion probability is peaked at the surface. Otherwise, no physical models of carrier transport or knowledge of the electric field profile in the CCD are needed. In suboptimal conditions, the upper bound increases and the lower bound is unaffected, so confidence in the correctness of results is retained. The new method has been benchmarked against Monte Carlo simulations and tested on X-ray images measured on thick high-resistivity prototype CCDs for the Large Synoptic Survey Telescope. In Monte Carlo simulations of noiseless images having the optimal diffusion scale, the upper bound approximated the true PSF within 5%, increasing to 10% in simulations with added noise. Even with severely undersampled or truncated PSFs, the method brackets the true value to within 25%. Our method is accurate and computationally efficient and offers a fast and simple experimental setup.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
Wind Data Inputs for Regional Wind Integration Studies: Preprint
This paper examines the methodologies used to create these datasets, the pitfalls that may be encountered, and the tradeoffs between different methodological approaches.
17 WIND ENERGY↗
Development of Regional Wind Resource and Wind Plant Output Datasets for the Hawaiian Islands
In March 2009, AWS Truepower was engaged by the National Renewable Energy Laboratory (NREL) to develop a set of wind resource and plant output data for the Hawaiian Islands. The objective of this project was to expand the methods and techniques employed in the Eastern Wind Integration and Transmission Study (EWITS) to include the state of Hawaii.
17 WIND ENERGY↗
Study of Pixel Area Variations in Fully Depleted Thick CCD
Future wide field astronomical surveys, like Large Synoptic Survey Telescope (LSST), require photometric precision on the percent level. The accuracy of sensor calibration procedures should match these requirements. Pixel size variations found in CCDs from different manufacturers are the source of systematic errors in the flat field calibration procedure. To achieve the calibration accuracy required to meet the most demanding science goals this effect should be taken into account. The study of pixel area variations was performed for fully depleted, thick CCDs produced in a technology study for LSST. These are n-channel, 100 {micro}m thick devices. We find pixel size variations in both row and column directions. The size variation magnitude is smaller in the row direction. In addition, diffusion is found to smooth out electron density variations. It is shown that the characteristic diffusion width can be extracted from the flat field data. Results on pixel area variations and diffusion, data features, analysis technique and modeling technique are presented and discussed.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
PSF and MTF Measurement Methods for Thick CCD Sensor Characterization
Knowledge of the point spread function (PSF) of the sensors to be used in the Large Synoptic Survey Telescope (LSST) camera is essential for optimal extraction of subtle galaxy shape distortions caused by gravitational weak lensing. We have developed a number of techniques for measuring the PSF of candidate CCD sensors to be used in the LSST camera, each with its own strengths and weaknesses. The two main optical PSF measurement techniques that we use are the direct Virtual Knife Edge (VKE) scan as developed by Karcher, et al. and the indirect interference fringe method after Andersen and Sorensen that measures the modulation transfer function (MTF) directly. The PSF is derived from the MTF by Fourier transform. Other non-optical PSF measurement techniques that we employ include {sup 55}Fe x-ray cluster image size measurements and statistical distribution analysis, and cosmic ray muon track size measurements, but are not addressed here. The VKE technique utilizes a diffraction-limited spot produced by a Point-Projection Microscope (PPM) that is scanned across the sensor with sub-pixel resolution. This technique closely simulates the actual operating condition of the sensor in the telescope with the source spot size having an f/number close to the actual telescope design value. The interference fringe method uses a simple equal-optical-path Michelson-type interferometer with a single-mode fiber source that produces interference fringes with 100% contrast over a wide spatial frequency range sufficient to measure the MTF of the sensor directly. The merits of each measurement technique and results from the various measurement techniques on prototype LSST sensors are presented and compared.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
CCD Base Line Subtraction Algorithms
High statistics astronomical surveys require photometric accuracy on a few percent level. The accuracy of sensor calibration procedures should match this goal. The first step in calibration procedures is the base line subtraction. The accuracy and robustness of different base line subtraction techniques used for Charge Coupled Device (CCD) sensors are discussed.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗