Width of Debye-Scherrer lines for finite spectral width of primary beam
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Ekstein, Hans↗
Engineering topics
Ekstein, Hans
Publications and source records attributed to Ekstein, Hans.
X-ray diffraction by bent crystal lamellae
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Ekstein, Hans↗
Statistical fluctuation of intensity in Debye-Scherrer lines due to random orientation of crystal grains
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X-RAY INSPECTION - CRYSTALS↗
Achromatization of Debye-Scherrer lines
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STRESS MEASUREMENT, X-RAY↗
Limits of Precision in the Determination of Lattice Parameters and Stresses by the Debye-scherrer Method
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METALS - CRYSTALLIZATION↗