LWIR detector behavior at very low frequencies
Measurements have been made of the signal and noise characteristics of extrinsic photoconductive silicon detectors. The measurements were made at several background levels, bias voltages and detector operating temperatures. Data are shown at modulation frequencies as low as 0.01 Hz, operating temperatures as low as 2.5K and background photon flux densities down to 8 x 10 to the 7th photons/sec-sq cm. Data on the temporal characteristics of the detector signal are presented. In addition, some interesting data on 'spontaneous noise spikes' are also shown.