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Edward J Wyrwas

Publications and source records attributed to Edward J Wyrwas.

13 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2024

EdgeCortix SAKURA-I Machine-Learning, PCIe Accelerator SEE Heavy Ion Test Report

To enable autonomy in space, machine-learning and computer vision applications become invaluable for sensor processing. However, these algorithms are computationally complex and unfeasible for many embedded central processing units (CPUs) and usually require external coprocessors, such as graphics processing units (GPUs) or accelerators specific to the application, including application specific integrated circuits (ASICs). In power-constrained systems, GPUs tend to consume more power than is acceptable (>40W), so lower-power accelerators have shown promise to provide the performance needed under spacecraft constraints. For radiation engineers, developing methodologies that can properly test CPUs, GPUs, and accelerators, and enable comparisons between them remains a necessary complication to solve as the devices become more complex. The methodology in this test aims to be a start in developing a baseline single-event effect (SEE) test for client-device machine learning accelerators. This category of devices do not host their own operating system. This testing campaign is a continuation of a previous 200 MeV proton test performed in January 2024. This report covers two heavy ion tests of the SAKURA-I card: one in April 2024, and one in June 2024. Additional data was needed after the April test due to ion-range issues experienced at higher linear-energy transfers (LETs). These range issues are described in more detail in Section 8. This experiment characterizes SEEs and data error susceptibility of the EdgeCortix SAKURA-I machine-learning accelerator under heavy ions. The device was monitored for single event upsets (SEUs) and single event functional interrupts (SEFIs) at the Lawrence Berkeley National Laboratory’s 88-inch cyclotron. The SAKURA-I board accelerates machine-learning inference applications on a host computer through a PCIex16 connection. For the purposes of devising an end to end automated analysis workflow for this experiment, the YOLO-V5 and SSD300 objection-detection models, and the ResNet-50, EfficientNet, and MobileNetV2 image classification models were used as a representative suite of analytical machine-learning models.

Seth S Roffe↗
NASA NTRS2023

An Examination of Heavy Ion-Induced Persistent Visual Error Signatures in an Electronic Display Driver Integrated Circuit

Given the ubiquity of electronic displays integration in human-based systems, the impending mission critical, space-based applications of electronic displays will necessitate SEE assessment of components unique to electronic displays. A commercially available DDIC designed to drive a small form factor organic light emitting diode (OLED) was visually monitored during heavy ion irradiation to catalogue radiation induced persistent visual error signatures that require manual intervention (i.e., power cycling) to return to nominal function. These error signatures were able to be reproduced via modification of configuration register values utilizing the instruction set intended for interfacing a microcontroller with the DDIC. This approach to emulation of heavy-ion induced errors on a table-top assists with human perception-based criticality analysis as well as development of mitigation techniques.

Electronic Displays↗
NASA NTRS2023

An Examination of Heavy Ion-Induced Persistent Visual Error Signatures in an Electronic Display Driver Integrated Circuit

Heavy ion irradiation of a display driver integrated circuit (DDIC) was performed, and persistent visual error signatures were captured. Based on the heavy ion results, error signatures were localized to configuration registers motivate potential mitigation techniques and observations relating to single event effect susceptibility. DDICs serve as an integral component of integrated display systems that will require the development of single event effects test methodologies in anticipation of extensive use in crewed spacecrafts outside of the Earth’s geomagnetic protection.

Electronic Displays↗
NASA NTRS2023

Proton Testing of AMD v1202b System on Chip

Single-Event Effects (SEE) testing was previously conducted on the AMD v1200 System on Chip (SoC) at Massachusetts General Hospital’s (MGH) Francis H. Burr Proton Therapy Center on May 28, 2022, using 200-MeV protons.

Edward J Wyrwas↗
NASA NTRS2021

Identifying Planetary Transit Candidates in TESS Full-frame Image Light Curves via Convolutional Neural Networks

The Transiting Exoplanet Survey Satellite(TESS)mission measured light from stars in∼75% of the sky throughout its 2 yr primary mission, resulting in millions of TESS 30-minute-cadence light curves to analyze in the search for transiting exoplanets. To search this vast data trove for transit signals, we aim to provide an approach that both is computationally efficient and produces highly performant predictions. This approach minimizes the required human search effort. We present a convolutional neural network, which we train to identify planetary transit signals and dismiss false positives. To make a prediction for a given light curve, our network requires no prior transit parameters identified using other methods. Our network performs inference on a TESS 30-minute-cadence light curve in∼5 ms on a single GPU, enabling large-scale archival searches. We present 181 new planet candidates identified by our network, which pass subsequent human vetting designed to rule out false positives.Our neural network model is additionally provided as open-source code for public use and extension

Gregory Olmschenk↗
NASA NTRS2020

NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.

Single Event Effects (SEE)↗
NASA NTRS2020

NEPP Processor Enclave: Testing Artificial Intelligence & Machine Learning

Computational device families are converging and multiple EEE components are required for a complete HPC subsystem. The components of this “processor enclave” are sensitive to radiation effects and therefore must be characterized for mission assurance. NEPP’s standardized approach to testing the Processor Enclave includes math, graphics, and AI and Machine Learning test vectors and device hardware capable of these applications.

Radiation testing↗