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Dunn, S. T.

Publications and source records attributed to Dunn, S. T..

Ellipsoidal-mirror reflectometer accurately measures infrared reflectance of materials

Reflectometer accurately measures the reflectance of specimens in the infrared beyond 2.5 microns and under geometric conditions approximating normal irradiation and hemispherical viewing. It includes an ellipsoidal mirror, a specially coated averaging sphere associated with a detector for minimizing spatial and angular sensitivity, and an incident flux chopper.

Dunn, S. T.