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Downing, R. D.

Publications and source records attributed to Downing, R. D..

Electron beam deflected to determine focal point location

System locates the focal point of an extremely high intensity electron beam. The electron beam is swept and scanned cyclically with deflection coils under a focusing lens, causing the beam focal point to move so the locus of its positions is a spherical surface symmetrical to the beam axis.

Downing, R. D.↗

Electron beam standby absorber system

Electron beam energy is absorbed by deflectors which allow beam distribution over an absorber located between the deflectors and workpiece. The undeflected beam passes through a hole in the absorber when the deflection is de-energized, when energized, the beam is kept to a minimum power level by deflection rate change.

Downing, R. D.↗