Engineering PapersSearch

Engineering topics

Dillow, C. F.

Publications and source records attributed to Dillow, C. F..

Vacuum-ultraviolet reflectometer

Baffle, three-blade chopper, and split spherical mirror transmit alternating dual beam into integrating sphere. Alternating reference and sample beams are detected by high gain photomultiplier and modified logarithmic ratiometer. Device is useful in fusion research, high power laser work, and spectrometer or monochromator construction.

Allen, T. H.

High temperature reflectance of hyperpure slip cast silica

An experimental program to optically characterize hyperpure slip cast silica at elevated temperatures is described. This sintered ceramic material is being used in the development of a reflective heat shield for the Outer Planet Entry Probe. A unique high temperature integrating sphere reflectometer is described and reflectance data in the spectral range 0.23-2.3 micron are presented at temperatures up to 1427 C in air and helium environments. Kubelka-Munk (K-M) scattering and absorptance coefficients (K and S), using the Reichman extension of the K-M theory, are presented as is a unique method of obtaining K and S from the Reichman equations using only reflectance data. The hyperpure slip cast silica material was found to retain its high diffuse reflectance at temperatures up to 1204 C, with slight degradation occurring at higher temperatures.

Dillow, C. F.

Evaluation and study of advanced optical contamination, deposition, measurement, and removal techniques

A program is described to design, fabricate and install an experimental work chamber assembly (WCA) to provide a wide range of experimental capability. The WCA incorporates several techniques for studying the kinetics of contaminant films and their effect on optical surfaces. It incorporates the capability for depositing both optical and contaminant films on temperature-controlled samples, and for in-situ measurements of the vacuum ultraviolet reflectance. Ellipsometer optics are mounted on the chamber for film thickness determinations, and other features include access ports for radiation sources and instrumentation. Several supporting studies were conducted to define specific chamber requirements, to determine the sensitivity of the measurement techniques to be incorporated in the chamber, and to establish procedures for handling samples prior to their installation in the chamber. A bibliography and literature survey of contamination-related articles is included.

Linford, R. M. F.

A system for the study of molecular contamination

An experimental vacuum chambers was designed and fabricated to provide a wide range of experimental capability. This work chamber assembly (WCA) was conceived to establish the proof-of-principle of various techniques for studying the kinetics of contaminants and their effects. It incorporates the capability for depositing both optical and contaminant films on temperature-controlled samples, and for in-situ measurements of the vacuum ultraviolet reflectance. Ellipsometer optics are mounted on the chamber for film thickness determinations, and other features include access ports for radiation sources and instrumentation.

Dillow, C. F.

The infrared properties of reusable surface insulations.

The total infrared scattering and absorption cross sections of both flexible and rigidized high temperature fibrous insulations have been measured. The methods for accomplishing these measurements are described. Infrared reflection and transmission spectra were obtained to study the dependence of the total cross sections on the spectral characteristics of the transported radiation. These results are applied to steady-state effective thermal conductivity measurements via a four-flux model of radiative heat transfer to separate the radiative component and to calculate the effective thermal conductivity under transient heating conditions. Data for both silica and mullite fibers are presented.

Schmitt, R. J.