Engineering topics

Conley, R.

Publications and source records attributed to Conley, R..

9 records

DOE OSTI2022

The EXO-200 detector, part II: auxiliary systems

The EXO-200 experiment searched for neutrinoless double-beta decay of 136 Xe with a single-phase liquid xenon detector. It used an active mass of 110 kg of 80.6%-enriched liquid xenon in an ultra-low background time projection chamber with ionization and scintillation detection and readout. Here, this paper describes the design and performance of the various support systems necessary for detector operation, including cryogenics, xenon handling, and controls. Novel features of the system were driven by the need to protect the thin-walled detector chamber containing the liquid xenon, to achieve high chemical purity of the Xe, and to maintain thermal uniformity across the detector.

47 OTHER INSTRUMENTATION↗

DOE OSTI2019

Precision Flexure Stages Design for a Compact Multilayer Laue Lens Test Bed for Hard X-ray Nanofocusing

Both the Advanced Photon Source (APS) at Argonne National Laboratory (ANL) and the Beijing Synchrotron Radiation Facility (BSRF) at Institute of High Energy Physics (IHEP) have a keen interest in the development of a compact Multilayer Laue Lens (MLL) test bed for hard x-ray nanofocusing. Recently, collaboration between ANL and IHEP, as a part of the Argonne Strategic Partnership Project (SPP) 85J05, has produced designs of precision flexure stages for a compact MLL test bed for hard x-ray nanofocusing using commercial flexural pivots and Argonne developed laminar nanopositioning flexures. Two sets of the new flexure stages will be built with the new designs, one for R&D activities at the BSRF for the new planned 6 GeV high energy photon source (HEPS) and one for upgrade of the existing MLL test bed at the APS x-ray optics test beamline. Mechanical design and preliminary test for the MLL test bed flexure stages for Argonne SPP project 85J05 are presented in this paper.

nanopositioning flexure stage↗

DOE OSTI2016

Nm-scale spatial resolution x-ray imaging with MLL nanofocusing optics: instrumentational requirements and challenges

The Hard X-ray Nanoprobe (HXN) beamline at NSLS-II has been designed and constructed to enable imaging experiments with unprecedented spatial resolution and detection sensitivity. The HXN X-ray Microscope is a key instrument for the beamline, providing a suite of experimental capabilities which includes scanning fluorescence, diffraction, differential phase contrast and ptychography utilizing Multilayer Laue Lenses (MLL) and zoneplate (ZP) as nanofocusing optics. In this paper, we present technical requirements for the MLL-based scanning microscope, outline the development concept and present first ~15 x 15 nm 2 spatial resolution x-ray fluorescence images.

47 OTHER INSTRUMENTATION↗

DOE OSTI2015

Binary pseudo-random patterned structures for modulation transfer function calibration and resolution characterization of a full-field transmission soft x-ray microscope

We present a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) one-dimensional sequences and two-dimensional arrays as an effective method for spectral characterization in the spatial frequency domain of a broad variety of metrology instrumentation, including interferometric microscopes, scatterometers, phase shifting Fizeau interferometers, scanning and transmission electron microscopes, and at this time, x-ray microscopes. The inherent power spectral density of BPR gratings and arrays, which has a deterministic white-noise-like character, allows a direct determination of the MTF with a uniform sensitivity over the entire spatial frequency range and field of view of an instrument. We demonstrate the MTF calibration and resolution characterization over the full field of a transmission soft x-ray microscope using a BPR multilayer (ML) test sample with 2.8 nm fundamental layer thickness. We show that beyond providing a direct measurement of the microscope’s MTF, tests with the BPRML sample can be used to fine tune the instrument’s focal distance. Our results confirm the universality of the method that makes it applicable to a large variety of metrology instrumentation with spatial wavelength bandwidths from a few nanometers to hundreds of millimeters.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

DOE OSTI2015