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Chipman, Russell A.

Publications and source records attributed to Chipman, Russell A..

27 records · Page 2

Polarization Aberrations

The analysis of the polarization characteristics displayed by optical systems can be divided into two categories: geometrical and physical. Geometrical analysis calculates the change in polarization of a wavefront between pupils in an optical instrument. Physical analysis propagates the polarized fields wherever the geometrical analysis is not valid, i.e., near the edges of stops, near images, in anisotropic media, etc. Polarization aberration theory provides a starting point for geometrical design and facilitates subsequent optimization. The polarization aberrations described arise from differences in the transmitted (or reflected) amplitudes and phases at interfaces. The polarization aberration matrix (PAM) is calculated for isotropic rotationally symmetric systems through fourth order and includes the interface phase, amplitude, linear diattenuation, and linear retardance aberrations. The exponential form of Jones matrices used are discussed. The PAM in Jones matrix is introduced. The exact calculation of polarization aberrations through polarization ray tracing is described. The report is divided into three sections: I. Rotationally Symmetric Optical Systems; II. Tilted and Decentered Optical Systems; and Polarization Analysis of LIDARs.

Mcguire, James P., Jr.

Optical properties monitor: Experiment definition phase

The stability of materials used in the space environment will continue to be a limiting technology for space missions. The Optical Properties Monitor (OPM) Experiment provides a comprehensive space research program to study the effects of the space environment (both natural and induced) on optical, thermal and space power materials. The OPM Experiment was selected for definition under the NASA/OAST In-Space Technology Experiment Program. The results of the OPM Definition Phase are presented. The OPM experiment will expose selected materials to the space environment and measure the effects with in-space optical measurements. In-space measurements include total hemispherical reflectance total integrated scatter and VUV reflectance/transmittance. The in-space measurements will be augmented with extensive pre- and post-flight sample measurements to determine other optical, mechanical, electrical, chemical or surface effects of space exposure. Environmental monitors will provide the amount and time history of the sample exposure to solar irradiation, atomic oxygen and molecular contamination.

Wilkes, Donald R.

Polarization considerations for optical systems II; Proceedings of the Meeting, San Diego, CA, Aug. 9-11, 1989

Various papers on polarization considerations for optical systems are presented. Individual topics addressed include: use of polarization methods in earth resources investigation, measurements of polarization scattering in the vacuum UV, the Space Shuttle as a polarization observation platform, analysis of spatial pseudodepolarizers in imaging systems, analysis of polarization effects in optical systems, and a low-polarization solar vector magnetograph. Consideration is given to polarization effects on astronomical spatial interferometry, measurement of the instrumental polarization of a high-resolution UV spectrometer, and the use of KD(asterisk)P modulators for polarization measurements of the sun.

Chipman, Russell A.

Polarization analysis of the Advanced X-ray Astrophysical Facility telescope assembly

The Advanced X-ray Astrophysical Facility (AXAF) telescope consists of six concentric paraboloid-hyperboloid pairs of mirrors operating near grazing incidence. Because of the substantial polarization effects at large angles of incidence, there is concern about the feasibility of polarimetry near the focal plane. The primary mirror acts as a tangentially directed half-wave linear retarder and nearly completely depolarizes the linearly polarized component of the light. The secondary mirror introduces an additional half wave of linear retardance. The tangentially directed one-wave linear retarder leaves the transmitted beam in the incident polarization state. The net instrumental polarization effects are small, and polarimetry is feasible with the AXAF.

Brown, Daniel M.

Optical properties monitor: Experiment definition phase

The stability of materials used in the space environment will continue to be a limiting technology for space missions. The Optical Properties Monitor (OPM) Experiment provides a comprehensive space research program to study the effects of the space environment-both natural and induced-on optical, thermal and space power materials. The OPM Experiment was selected for definition under the NASA/OAST In-Space Technology Experiment Program. The results of the OPM Definition Phase are presented. The OPM Experiment will expose selected materials to the space environment and measure the effects with in-space optical measurements. In-space measurements include total hemispherical reflectance total integrated scatter and VUV reflectance/transmittance. The in-space measurements will be augmented with extensive pre- and post-flight sample measurements to determine other optical, mechanical, electrical, chemical or surface effects of space exposure. Environmental monitors will provide the amount and time history of the sample exposure to solar irradiation, atomic oxygen and molecular contamination.

Wilkes, Donald R.

Polarization analysis of optical systems

For most optical systems it is typically assumed that the transmitted wavefront has uniform (or Gaussian) amplitude and constant polarization state. This is the default assumption of geometrical optics. This paper considers methods suitable for analyzing systems for which this assumption is not valid. Such methods of polarization analysis include polarization ray tracing and polarization aberration theory. Definitions of the basic classes of polarization phenomena and a review of the Jones calculus are included to form a basis for the discussion.

Chipman, Russell A.

Polarization aberrations in the solar activity measurements experiments (SAMEX) solar vector magnetograph

An optical design and polarization analysis of the Air Force/NASA Solar Activity Measurements Experiments solar vector magnetograph optical system is performed. Polarization aberration theory demonstrates that conventional telescope coating designs introduce unacceptably high levels of polarization aberrations into the optical system. Several ultralow polarization mirror and lens coatings designs for this instrument are discussed. Balancing of polarization aberrations at different surfaces is demonstrated.

Mcguire, James P., Jr.

Polarization aberrations in optical systems

This paper examines the polarization aberrations in optical systems of isotropic radially symmetric weak polarizers in the paraxial approximation. Optical systems which fit this description are composed of uncoated and coated lenses and mirrors. Polarization aberrations are variations in phase, amplitude, and polarization state of the electromagnetic field across the exit pupil. Some are dependent on the incident polarization state and some are not. Expressions through fourth order for phase, amplitude, linear polarization, and linear retardance aberrations are derived in terms of the chief and marginal ray angles of incidence and Taylor series expansion coefficients of the Fresnel equations for reflection and transmission at interfaces.

Mcguire, James P., Jr.

Polarization analysis of a balloon-borne solar magnetograph

The main text of the report contains the particular results of our research which relate to the Experimental Vector Magnetograph (EXVM) and the Balloon-borne Vector Magnetograph (BVM). A brief overview of which elements in the EXVM and BVM that are relevant to this polarization analysis are presented. The possible meaning of the 10(exp -5) polarization specification for the BVM is discussed qualitatively. A recommendation of which polarization specification is most relevant for the BVM is provided. A diattenuation budget for the various surfaces in the BVM which will allow the polarization specification to be met is discussed. An explanation of the various coating specifications which are recommended is presented. Optical design of the EXVM and coating specification sheets for the BVM are presented. The appendices of this report contain the more general results of our research on the general topic of polarization aberrations. A general discussion of polarization aberration theory, in terms of the SAMEX solar magnetograph, and rigorous derivations for the Mueller matrices of optical systems are also presented in the appendices.

Reiley, Daniel J.