Engineering topics

Chern, E. James

Publications and source records attributed to Chern, E. James.

13 records

NASA NTRS2004

Assurance Technology Challenges of Advanced Space Systems

The initiative to explore space and extend a human presence across our solar system to revisit the moon and Mars post enormous technological challenges to the nation's space agency and aerospace industry. Key areas of technology development needs to enable the endeavor include advanced materials, structures and mechanisms; micro/nano sensors and detectors; power generation, storage and management; advanced thermal and cryogenic control; guidance, navigation and control; command and data handling; advanced propulsion; advanced communication; on-board processing; advanced information technology systems; modular and reconfigurable systems; precision formation flying; solar sails; distributed observing systems; space robotics; and etc. Quality assurance concerns such as functional performance, structural integrity, radiation tolerance, health monitoring, diagnosis, maintenance, calibration, and initialization can affect the performance of systems and subsystems. It is thus imperative to employ innovative nondestructive evaluation methodologies to ensure quality and integrity of advanced space systems. Advancements in integrated multi-functional sensor systems, autonomous inspection approaches, distributed embedded sensors, roaming inspectors, and shape adaptive sensors are sought. Concepts in computational models for signal processing and data interpretation to establish quantitative characterization and event determination are also of interest. Prospective evaluation technologies include ultrasonics, laser ultrasonics, optics and fiber optics, shearography, video optics and metrology, thermography, electromagnetics, acoustic emission, x-ray, data management, biomimetics, and nano-scale sensing approaches for structural health monitoring.

Chern, E. James↗

NASA NTRS1998

Non-Contact EDDY Current Hole Eccentricity and Diameter Measurement

Precision holes are among the most critical features of a mechanical component. Deviations from permissible tolerances can impede operation and result in unexpected failure. We have developed an automated non-contact eddy current hole diameter and eccentricity measuring system. The operating principle is based on the eddy current lift-off effect, which is the coil impedance as a function of the distance between the coil and the test object. An absolute eddy current probe rotates in the hole. The impedance of each angular position is acquired and input to the computer for integration and analysis. The eccentricity of the hole is the profile of the impedance as a function of angular position as compared to a straight line, an ideal hole. The diameter of the hole is the sum of the diameter of the probe and twice the distance-calibrated impedance. An eddy current image is generated by integrating angular scans for a plurality of depths between the top and bottom to display the eccentricity profile. This system can also detect and image defects in the hole. The method for non-contact eddy current hole diameter and eccentricity measurement has been granted a patent by the U.S. Patent and Trademark Office.

Chern, E. James↗

NASA NTRS1994

Adjustable Deflector For Ultrasonic C-Scan

Adjustable deflector increases versatility of ultrasonic C-scan system equipped with two-axis (x-y) translation stage. Enables system to scan along additional axis perpendicular (z axis) or tilted (z' axis) with respect to y axis. Modification of two-axis scanner is economical alternative to more-complicated scanner.

Chern, E. James↗

NASA NTRS1994

Ultrasonic Inspection Of Composite-Material Paraboloid

Ultrasonic imaging system scanning three-dimensional curved surfaces developed. In original application, system used to determine integrity of composite-material paraboloidal reflector and its supporting structure. System also used to inspect composite-material structures with curved surfaces other than paraboloids, provided surfaces describable by mathematical functions. Position and orientation of transducer adjusted continuously to maintain normal incidence.

Chern, E. James↗

NASA NTRS1994

A versatile nondestructive evaluation imaging workstation

Ultrasonic C-scan and eddy current imaging systems are of the pointwise type evaluation systems that rely on a mechanical scanner to physically maneuver a probe relative to the specimen point by point in order to acquire data and generate images. Since the ultrasonic C-scan and eddy current imaging systems are based on the same mechanical scanning mechanisms, the two systems can be combined using the same PC platform with a common mechanical manipulation subsystem and integrated data acquisition software. Based on this concept, we have developed an IBM PC-based combined ultrasonic C-scan and eddy current imaging system. The system is modularized and provides capacity for future hardware and software expansions. Advantages associated with the combined system are: (1) eliminated duplication of the computer and mechanical hardware, (2) unified data acquisition, processing and storage software, (3) reduced setup time for repetitious ultrasonic and eddy current scans, and (4) improved system efficiency. The concept can be adapted to many engineering systems by integrating related PC-based instruments into one multipurpose workstation such as dispensing, machining, packaging, sorting, and other industrial applications.

Chern, E. James↗

NASA NTRS1993

Unified Ultrasonic/Eddy-Current Data Acquisition

Imaging station for detecting cracks and flaws in solid materials developed combining both ultrasonic C-scan and eddy-current imaging. Incorporation of both techniques into one system eliminates duplication of computers and of mechanical scanners; unifies acquisition, processing, and storage of data; reduces setup time for repetitious ultrasonic and eddy-current scans; and increases efficiency of system. Same mechanical scanner used to maneuver either ultrasonic or eddy-current probe over specimen and acquire point-by-point data. For ultrasonic scanning, probe linked to ultrasonic pulser/receiver circuit card, while, for eddy-current imaging, probe linked to impedance-analyzer circuit card. Both ultrasonic and eddy-current imaging subsystems share same desktop-computer controller, containing dedicated plug-in circuit boards for each.

Chern, E. James↗

NASA NTRS1993

Automated Surface Profilometer

Computer-controlled system saves time and labor. Electromechanical scanning system automatically measures deviation of sheets and plates from flatness. Quickly measures surface profile and detects bumps, bulges, and indentations as small as 0.001 in. in height or depth. X-y table moves specimen to programmed locations under digital linear variable differential transformer (LVDT) while computer records surface-height readings of LVDT. Resulting graphical display shows surface contour.

Chern, E. James↗

NASA NTRS1993

Firmware Development Improves System Efficiency

Most manufacturing processes require physical pointwise positioning of the components or tools from one location to another. Typical mechanical systems utilize either stop-and-go or fixed feed-rate procession to accomplish the task. The first approach achieves positional accuracy but prolongs overall time and increases wear on the mechanical system. The second approach sustains the throughput but compromises positional accuracy. A computer firmware approach has been developed to optimize this point wise mechanism by utilizing programmable interrupt controls to synchronize engineering processes 'on the fly'. This principle has been implemented in an eddy current imaging system to demonstrate the improvement. Software programs were developed that enable a mechanical controller card to transmit interrupts to a system controller as a trigger signal to initiate an eddy current data acquisition routine. The advantages are: (1) optimized manufacturing processes, (2) increased throughput of the system, (3) improved positional accuracy, and (4) reduced wear and tear on the mechanical system.

Chern, E. James↗

NASA NTRS1992

Eddy current characterization of magnetic treatment of materials

Eddy current impedance measuring methods have been applied to study the effect that magnetically treated materials have on service life extension. Eddy current impedance measurements have been performed on Nickel 200 specimens that have been subjected to many mechanical and magnetic engineering processes: annealing, applied strain, magnetic field, shot peening, and magnetic field after peening. Experimental results have demonstrated a functional relationship between coil impedance, resistance and reactance, and specimens subjected to various engineering processes. It has shown that magnetic treatment does induce changes in a material's electromagnetic properties and does exhibit evidence of stress relief. However, further fundamental studies are necessary for a thorough understanding of the exact mechanism of the magnetic-field processing effect on machine tool service life.

Chern, E. James↗

NASA NTRS1992

Scanning System Acquires Data At Designated Coordinates

Firmware in computer-controlled electromechanical scanning apparatus enables acquisition of data "on the fly" - as scanning head passes through designated positions on plane. Scanning motion steady, no sacrifice of positional accuracy. Control system has "Interrupt" structure commanding central processing unit to enter data-acquisition routine when x-y table reaches designated measurement positions. Adaptable to systems required to take data, or perform machining operations at designated positions.

Chern, E. James↗

NASA NTRS1992

Ultrasonic Imaging Of Bond Layers Through Bond Layers

Combination of hardware and software helps ultrasonic C-scan inspection system create images of bond layer in laminated composite material, even when obscured by another bond layer. Produces image of both layers in single scan. Includes ultrasonic transducer, pulser/receiver, mechanical scanner, personal computer as controller, and electronic circuitry that gates first and second peak signals, detects peaks, and feeds resulting amplitude data to computer.

Chern, E. James↗

NASA NTRS1990

Generalized pulse equations for through-transmission evaluation of arbitrary multilayered structures

Generalized transit time and pulse amplitude equations were derived for modelling the ultrasonic through-transmission wave propagation of an arbitrary n-layered structure. The equations can be programmed into an expert system and used to identify and predict the through-transmission pulse signals from the critical interfaces of a multilayered structure. To test the formulas, the through transmission was measured from one- and three-layered configurations in the laboratory. The experimental measurements were compared with computer-generated data determined using the derived equations. The results verify the validity of the formulas.

Chern, E. James↗

NASA NTRS1990

Generalized pulse equations for through-transmission evaluation of arbitrary multilayered structures

Generalized transit-time and pulse-amplitude equations have been derived for modeling the ultrasonic through-transmission wave propagation of an arbitrary n-layered structure. The equations can be programmed into an expert system and used to identify and predict the through-transmission pulse signals from the critical interfaces of a multilayered structure. To test the formulas, the through-transmission responses from one- and three-layered configurations were measured in the laboratory and compared with computer-generated data that were determined using the derived equations. The results verify the validity of the formulas.

Chern, E. James↗