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Cheng, L.-J.

Publications and source records attributed to Cheng, L.-J..

MECA Electrometer: Initial Experimental Results

The Mars '01 lander contains an electrometer designed to evaluate the electrostatic nature of the Martian regolith (soil) and atmosphere. The electrometer is part of MECA (Mars Environmental Compatibility Assessment) project. The objective is to gain a better understanding of the hazards related to the human exploration of Mars The sensor has an electric field sensitivity of 35 kV/cm-V and room temperature drift of about 3 microV/sec. The sensor has been operated as low as -60 C where the drift is undetected.

Buehler, M.

MECA Electrometer: Initial Experimental Results

The Mars '01 lander contains an electrometer designed to evaluate the electrostatic nature of the Martian regolith (soil) and atmosphere. The electrometer is part of MECA (Mars Environmental Compatibility Assessment) project. The objective is to gain a better understanding of the hazards related to the human exploration of Mars The sensor has an electric field sensitivity of 35 kV/cm V and room temperature drift of approx. 3 micro V/sec. The sensor has been operated as low as - 60 C where the drift is undetected. Additional information is contained in the original extended abstract.

Buehler, M.

Polarimetric Multispectral Imaging Technology

The Jet Propulsion Laboratory is developing a remote sensing technology on which a new generation of compact, lightweight, high-resolution, low-power, reliable, versatile, programmable scientific polarimetric multispectral imaging instruments can be built to meet the challenge of future planetary exploration missions. The instrument is based on the fast programmable acousto-optic tunable filter (AOTF) of tellurium dioxide (TeO2) that operates in the wavelength range of 0.4-5 microns. Basically, the AOTF multispectral imaging instrument measures incoming light intensity as a function of spatial coordinates, wavelength, and polarization. Its operation can be in either sequential, random access, or multiwavelength mode as required. This provides observation flexibility, allowing real-time alternation among desired observations, collecting needed data only, minimizing data transmission, and permitting implementation of new experiments. These will result in optimization of the mission performance with minimal resources. Recently we completed a polarimetric multispectral imaging prototype instrument and performed outdoor field experiments for evaluating application potentials of the technology. We also investigated potential improvements on AOTF performance to strengthen technology readiness for applications. This paper will give a status report on the technology and a prospect toward future planetary exploration.

Cheng, L.-J.

Characterization of the heavily doped emitter and junction regions of silicon solar cells using an electron beam

Heavily doped emitter and junction regions of silicon solar cells are investigated by means of the electron-beam-induced-current (EBIC) technique. Although the experimental EBIC data are collected under three-dimensional conditions, it is analytically demonstrated with two numerical examples that the solutions obtained with one-dimensional numerical modeling are adequate. EBIC data for bare and oxide-covered emitter surfaces are compared with theory. The improvement in collection efficiency when an emitter surface is covered with a 100-A SiO2 film varies with beam energy; for a cell with a junction depth of 0.35 microns, the improvement is about 54 percent at 2 keV.

Luke, K. L.

Quantification of the effects of generation volume, surface recombination velocity, and diffusion length on the electron-beam-induced current and its derivative Determination of diffusion lengths in the low micron and submicron ranges

A systematic and quantitative analysis is carried out to investigate the effects of the shape (point, cube, Gaussian) and size of the generation volume, the surface recombination velocity, and the diffusion length on the electron-beam-induced current (EBIC) and its derivative (DEIC). Thick homogeneously doped samples exhibiting diffusion lengths in the low micron and submicron range are considered. The results are presented in computed EBIC curves as a function of scanning distance and of the ratio true diffusion length/effective diffusion length. Shown using these curves are: (1) a simple and yet rigorous method for the determination of the true diffusion length, taking into consideration all of the factors cited above, (2) a method for the rapid determination of the surface recombination velocity, (3) the condition under which the source shape becomes insignificant, and (4) a new value for the lower limit of the diffusion length which can be determined by the EBOC technique.

Luke, K. L.

Electron-beam induced current characterization of back-surface field solar cells using a chopped scanning electron microscope beam

A chopped electron beam induced current (EBIC) technique for the chacterization of back-surface field (BSF) solar cells is presented. It is shown that the effective recombination velocity of the low-high junction forming the back-surface field of BSF cells, in addition to the diffusion length and the surface recombination velocity of the surface perpendicular to both the p-n and low-high junctions, can be determined from the data provided by a single EBIC scan. The method for doing so is described and illustrated. Certain experimental considerations taken to enhance the quality of the EBIC data are also discussed.

Luke, K. L.