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Blount, R. L.

Publications and source records attributed to Blount, R. L..

The electromagnetic environment for the Space Shuttle orbiter

The electromagnetic environment of the Shuttle orbiter is discussed with respect to the electromagnetic compatibility of the orbiter and its cargo. Effects on payloads of the orbiter's Ku-band antenna are considered, along with the effects of unintentional emissions in the cargo bay, the magnetic fields produced by the orbiter and various payloads, lightning-produced magnetic fields, and noise and transients in the AC and DC power buses. Special EMI testing is described that was carried out to substantiate the orbiter's electromagnetic compatibility. It is concluded that the orbiter presents a very benign electromagnetic environment for cargo except for payloads or experiments that use very sensitive receivers or instruments that can measure low magnetic or electric fields.

Giffin, B. L.

Space Shuttle Lightning Protection

The technology for lightning protection of even the most advanced spacecraft is available and can be applied through cost-effective hardware designs and design-verification techniques. In this paper, the evolution of the Space Shuttle Lightning Protection Program is discussed, including the general types of protection, testing, and anlayses being performed to assess the lightning-transient-damage susceptibility of solid-state electronics.

Suiter, D. L.

ASTP simulated lightning test report

A simulated lightning test was conducted on the backup spacecraft for the Apollo Soyuz Test Project mission (CSM-119) to determine the susceptibility of the Apollo spacecraft to damage from the indirect effects of lightning. It is demonstrated that induced lightning effects from low-level injected currents can be scaled linearly to those which are obtained in a full threat lightning stroke. Test results indicate that: (1) many of the power and signal critical circuits would fail if subjected to full-threat lightning, (2) pyrotechnic circuits are safe for full-threat lightning, and (3) common-mode voltages exceeded the failure criteria level for all but three of the circuits tested.

Blount, R. L.