Barbour, A. | Engineering Papers

DOE OSTI2024

Capping Effects on Spin and Charge Excitations in Parent and Superconducting Nd 1-x Sr x⁢ NiO 2

Superconductivity in infinite layer nickelates Nd 1-x⁢ Sr x NiO 2 has so far been achieved only in thin films, raising questions on the role of substrates and interfaces. Given the challenges associated with their synthesis it is imperative to identify their intrinsic properties. We use resonant inelastic x-ray scattering to investigate the influence of the SrTiO 3 capping layer on the excitations of Nd 1-x ⁢Sr x⁢ NiO 2 (x =0 and 0.2). Spin excitations are observed in parent and 20% doped Nd 1-x Sr x ⁢NiO 2 regardless of capping, proving that magnetism is intrinsic to infinite-layer nickelates and appears in a significant fraction of their phase diagram. In parent and superconducting Nd 1-x Sr x ⁢NiO 2 , the spin excitations are slightly hardened in capped samples compared to the noncapped ones. Additionally, a weaker Ni-Nd charge transfer peak at ~0.6 eV suggests that the hybridization between Ni 3⁢d and Nd 5⁢d orbitals is reduced in capped samples. In conclusion, from our data, capping induces only minimal differences in Nd 1-x Sr x NiO 2 and we phenomenologically discuss these differences based on the reconstruction of the SrTiO 3 -NdNiO 2 interface and other mechanisms such as crystalline disorder.

36 MATERIALS SCIENCE↗

DOE OSTI2021

Analysis of the EMCCD point-source response using x-rays

Electron Multiplying Charge Coupled Devices, EMCCD are used as x-ray detectors. The NSLS-II Soft Inelastic x-ray Scattering (SIX) beam line has two EMCCDs for x-ray detection in the spectrometer arm. The spectrometer with high resolving power disperses x-rays vertically. The x-ray vertical position on the sensor plane is related to its energy. This allows for very accurate x-ray energy measurements through x-ray coordinates. X-rays interact with silicon and create a number of electron-hole pairs proportional to the x-ray energy. Electrons drift and diffuse toward pixel gates and are collected there. The diffused electrons form a charge cloud distributed over several neighboring pixels. This charge sharing enables coordinate measurements with accuracy better than the pixel pitch. The charge distribution shape has to be taken into account to achieve ultimate accuracy in coordinate measurements. In this paper, we present a method of the charge distribution shape analysis and demonstrate its applications. The drift and diffusion of electrons ftom the point of generation to pixel gates results in the bell-shaped electron cloud usually approximated by Gaussian shape. The number of electrons collected under a pixel is proportional to the shape function integral. These electron packets get transferred to the sense node of the output amplifier. The transfer process could introduce distortions to the original charge distribution. For example, during transfers, electrons in the packet could be exposed to traps if they are present in the sensor. The trapping and later the release processes distort the apparent shape of the charge distribution. Therefore, deviations of the charge distribution shape ftom the originally symmetrical form can indicate the presence of trap centers in the sensor and can be used for sensor diagnostics.

47 OTHER INSTRUMENTATION↗