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Barbee, T. W., Jr.

Publications and source records attributed to Barbee, T. W., Jr..

9 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1988

Monochromatic X-ray and XUV imaging with multilayer optics

The development of techniques for the fabrication of multilayer coated mirrors which can function as energy selective X-ray and XUV mirrors at normal incidence has greatly expanded the options available to the astronomical spectroscopist. A rocket spectroheliograph which utilizes multilayer optics in three configurations has been developed. These are: (1) as Cassegrain telescopes for imaging at 256 A (He II) and 173 A (Fe IX, X); (2) as tertiary mirrors used with a conventional Wolter I telescope for imaging at 44 A (Si XI, XII), 173 A, and 256 A; and (3) as off-axis spherical mirrors for imaging at 44 A and 256 A. The paper reports on laboratory images and performance measurements obtained with these optical systems, and briefly on Solar Observations.

Walker, A. B. C., Jr.↗
NASA NTRS1985

Molybdenum-silicon multilayer mirrors for the extreme ultraviolet

Multilayer structures of molybdenum and silicon have been synthesized by sputter deposition onto flat silicon single-crystal silicon substrates and spherically ground (0.5and 22.0-m radii) fused silica substrates; and the reflectivities for 170.4-A (72.8-eV), 160.1-A (77.4-eV), and 228-A (54.4-eV) light measured at near normal incidence. Observed peak values ranged from 26.2 to 78 percent, the highest reflectivities occurring closest to normal incidence. Energy resolutions were about 10 in all cases. Model calculations were performed using optical constants and experimentally determined multilayer structural parameters. In all cases the measured reflectivities were equal to or larger (by up to a factor of 2) than the calculated values, a result attributed to uncertainty in the optical constants used in the calculations. Experimental and calculated angular-peak positions and energy resolutions were in good agreement. The high reflectivities of these molybdenum-silicon structures will make possible application of traditional optics approaches in the EUV and support new developments including free-electron lasers.

Barbee, T. W., Jr.↗
NASA NTRS1983

Normal-Incidence Soft-X-Ray Mirror

Multilayered interference structure has about 6 percent reflectivity. Normal-incidence X-Ray Mirror, bent into spherical surface of radius 1.1mm used to image electroformed-nickel grid onto photographic film sensitive to soft X-rays. Grid set at distance of 1,067 mm from mirror, illuminated by simple Coolidge-type X-ray tube with carbon anode operated from 1.5KV supply. Film set at distance of 1,186 mm from mirror with resultant magnification of 1.11.

Underwood, J. H.↗
NASA NTRS1981

Soft X-ray imaging with a normal incidence mirror

By sputtering, it is possible to make multilayered structures (layered synthetic microstructures or LSMs) with individual layers as thin as a fraction of a nanometer. These techniques have been used to make a multilayered interference mirror to reflect carbon K X rays (at a wavelength of 4.48 nm) at normal incidence. The structure consists of 76 layers of tungsten of thickness 0.765 nm with layers of carbon (thickness 1.510 nm) interspersed, deposited on a 111 line type silicon wafer substrate. This LSM was formed into a concave mirror of radius approximately 1.1 m by bending the substrate, and used in an optical set-up to form images of grids illuminated by an X-ray source. The mirror was found to have a resolution of 5 lines/mm and an efficiency, integrated over the CK band, of between 4 and 8%.

Underwood, J. H.↗
NASA NTRS1981

Layered synthetic microstructures as Bragg diffractors for X rays and extreme ultraviolet - Theory and predicted performance

The theory of X-ray diffraction by periodic structures is applied to the layered synthetic microstructures (LSMs) made possible by recent developments in thin film technology, and approximate formulas for estimating their performance are presented. A more complete computation scheme based on optical multilayer theory is also described, and it is shown that the diffracting properties may be tailored to specific applications by adjusting the refractive indices and thicknesses of the component layers. The theory may be modified to take account of imperfections in the LMS structure, and the properties of nonperiodic structures thereby computed. Structures with high integrated reflectivity constructed according to the methods defined have potential application in many areas of X-ray or EUV research and instrumentation.

Underwood, J. H.↗
NASA NTRS1979

Layered synthetic microstructures - Properties and applications in X-ray astronomy

Refinements in vacuum deposition technology have made it possible to produce structures in which two materials are arranged in alternating layers of uniform thickness and as thin as 5 A. Such structures act as Bragg diffractors or 'artificial crystals' for X-rays, as well as they may be regarded as multilayer interference coatings. A dynamical theory is used to show how the properties of layered synthetic microstructures are dependent on the layer materials and thicknesses and how these properties can be tailored to specific applications. Laboratory results at various X-ray wavelengths are presented. In particular, specific X-ray astronomy applications in spectroscopy, imaging, polarimetry and laboratory calibration are discussed.

Underwood, J. H.↗