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Andrews, C. W.

Publications and source records attributed to Andrews, C. W..

9 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1981

Degradation of a two-layer thermal barrier coating under thermal cycling

A two-layer plasma-sprayed thermal barrier coating on a directionally solidified nickel-base eutectic alloy substrate was characterized prior to and after thermal cycling to 1095 C in an accelerated furnace test. The coating was comprised of an inner layer of Ni-16.4Cr-5.1Al-0.15Y (wt%) bond coat and an outer layer of ZrO2-7.9Y2O3 (wt%) thermal barrier. Characterization of the bond coat revealed that substantial amounts of yttrium and aluminum were oxidized during plasma-spraying in air. The oxidation of these elements reduced the protective capacity of the bond coat so that, on thermal exposure, severe degradation of the bond coat resulted and large amounts of nickel oxide formed. This nickel oxide was demonstrated to grow outward into the thermal barrier, which appears to have increased the stresses in the thermal barrier and contributed to its failure near the thermal barrier-bond coat interface.

Maier, R. D.↗
NASA NTRS1977

Application of the SEM to the measurement of solar cell parameters

A pair of techniques are described which make use of the SEM to measure, respectively, the minority carrier diffusion length and the metallurgical junction depth in silicon solar cells. The former technique permits the measurement of the true bulk diffusion length through the application of highly doped field layers to the back surfaces of the cells being investigated. The technique yields an absolute value of the diffusion length from a knowledge of the collected fraction of the injected carriers and the cell thickness. It is shown that the secondary emission contrast observed in the SEM on a reverse-biased diode can depict the location of the metallurgical junction if the diode has been prepared with the proper beveled geometry. The SEM provides the required contrast and the option of high magnification, permitting the measurement of extremely shallow junction depths.

Weizer, V. G.↗
NASA NTRS1977

Application of the SEM to the measurement of solar cell parameters

Techniques are described which make use of the SEM to measure the minority carrier diffusion length and the metallurgical junction depth in silicon solar cells. The former technique permits the measurement of the true bulk diffusion length through the application of highly doped field layers to the back surfaces of the cells being investigated. It is shown that the secondary emission contrast observed in the SEM on a reverse-biased diode can depict the location of the metallurgical junction if the diode has been prepared with the proper beveled geometry. The SEM provides the required contrast and the option of high magnification, permitting the measurement of extremely shallow junction depths.

Weizer, V. G.↗
NASA NTRS1976

Volume Fraction Determination in Cast Superalloys and DS Eutectic Alloys by a New Practice for Manual Point Counting

Volume fraction of a constituent or phase was estimated in six specimens of conventional and DS-eutectic superalloys, using ASTM E562-76, a new standard recommended practice for determining volume fraction by systematic manual point count. Volume fractions determined ranged from 0.086 to 0.36, and with one exception, the 95 percent relative confidence limits were approximately 10 percent of the determined volume fractions. Since the confidence-limit goal of 10 percent, which had been arbitrarily chosen previously, was achieved in all but one case, this application of the new practice was considered successful.

Andrews, C. W.↗
NASA NTRS1976

Resistance of a directionally solidified gamma/gamma prime-delta eutectic alloy to recrystallization

A lamellar nickel-base directionally-solidified eutectic gamma/gamma prime-delta alloy has potential as an advanced gas turbine blade material. The microstructural stability of this alloy was investigated. Specimens were plastically deformed by uniform compression or Brinell indentation, then annealed between 750 and 1120 C. Microstructural changes observed after annealing included gamma prime coarsening, pinch-off and spheroidization of delta lamellae, and appearance of an unidentified blocky phase in surface layers. All but the first of these was localized in severely deformed regions, suggesting that microstructural instability may not be a serious problem in the use of this alloy.

Tewari, S. N.↗
NASA NTRS1975

Resistance of a gamma/gamma prime - delta directionally solidified eutectic alloy to recrystallization

The lamellar directionally solidified nickel-base eutectic alloy gamma/gamma prime-delta has potential as an advanced turbine blade material. The microstructural stability of this alloy was investigated. Specimens were plastically deformed by uniform compression or Brinell indentation, then annealed between 705 and 1120 C. Microstructural changes observed after annealing included gamma prime coarsening, pinch-off and spheroidization of delta lamellae, and the appearance of an unidentified blocky phase in surface layers. All but the first of these was localized in severely deformed regions, suggesting that microstructural instability is not a serious problem in the use of this alloy.

Tewari, S. N.↗