Engineering topics

Alterovitz, S.

Publications and source records attributed to Alterovitz, S..

3 records

NASA NTRS1978

Reactively evaporated films of copper molybdenum sulfide

Films of superconducting Chevrel-phase copper molybdenum sulfide CuxMo6S8 were deposited on sapphire substrates by reactive evaporation using H2S as the reacting gas. Two superconducting temperatures (10.0 K and 5.0 K) of the films were found, corresponding to two different phases with different copper concentrations. All films were superconducting above 4.2 K and contained Chevrel-phase compound as well as free molybdenum. The critical current was measured as a function of applied field. One sample was found to deviate from the scaling law found for co-evaporated or sputtered samples, which possibly indicates a different pinning mechanism or inhomogeneity of the sample.

Chi, K. C.↗

NASA NTRS1977

Superconductivity in sputtered CuMo6S8

The superconducting transition temperature and the superconducting upper critical fields for sputtered films of copper-containing ternary molybdenum chalcogenides (chevrel phases) were determined. The theory presented by Werthamer, Helfand, and Hohenberg (WHH) (1966) was used to make computer-generated plots of the superconducting upper critical field values versus the superconducting transition temperature values for various values of the Maki paramagnetic pair-breaking parameter and the spin-orbit scattering parameter. The interpretation of the graph suggests that the experimental data for at least one sample are above the maximum WHH theoretical limit in the lower temperature range. Possible explanations of this situation are discussed. In other calculations, a scaling law was found suitable for determining pinning force densities; this data was used to calculate critical current values. The relation between resistivity and temperature was studied.

Alterovitz, S.↗

NASA NTRS1977

Superconductivity in sputtered CuMO6S8

Samples were prepared by melting the metals, followed by annealing to various temperatures. The result was a structurally weak material. Sputtered films on sapphire substrates were prepared and studied. The substrates give the films mechanical strength and permit easy attachment of electrical leads. Materials were characterized by X-ray diffraction, electron microscopy, electrical resistance vs. temperature, and critical current measurements. Some of the results on CuMo6S8 are presented.

Alterovitz, S.↗