Engineering topics
Publications and source records attributed to Almasi, G. S..
Rotating magnetic field of bubble domain memory is used to obtain time-division multiplexing of bubble domain circuits into quadrants. Memory bits are assigned on bit-per-chip rather than bit-per-module basis; power is reduced by circulating only portion of bubbles at a time.
Fabrication of integrated circuit chips to compensate for faulty memory elements is discussed. Procedure for testing chips to determine extent of redundancy and faults is described. Mathematical model to define operation is presented. Schematic circuit diagram of test equipment is provided.
CdTe-HgTe heterostructures preparation with minimum energy gaps, showing photovoltaic effect caused by undesirable p-n junction due to Cd vacancy formation
Photovoltaic effects in cadmium telluride-mercury telluride heterostructures
Heat flow problem in electron beam microprobe analysis of aluminum layer deposited on sample target